EE141 VLSI Test Principles and Architectures Test Generation 1 1 中科院研究生院课程： VLSI 测试与可测试性设计 第 5 讲 测试生成 (1) 李晓维 中科院计算技术研究所

EE141 VLSI Test Principles and Architectures Test Generation 2 2 Chapter 4 Test Generation

EE141 VLSI Test Principles and Architectures Test Generation 3 3 What is this chapter about?  Introduce the basic concepts of ATPG  Focus on a number of combinational and sequential ATPG techniques  Deterministic ATPG and simulation-based ATPG  Fast untestable fault identification  ATPG for various fault models

EE141 VLSI Test Principles and Architectures Test Generation 4 4  Introduction  Random Test Generation  Theoretical Foundations  Deterministic Combinational ATPG  Deterministic Sequential ATPG  Untestable Fault Identification  Simulation-based ATPG  ATPG for Delay and Bridge Faults  Other Topics in Test Generation  Concluding Remarks

EE141 VLSI Test Principles and Architectures Test Generation 5 5 Introduction  Test generation is the bread-and-butter in VLSI Testing  Efficient and powerful ATPG can alleviate high costs of DFT  Goal: generation of a small set of effective vectors at a low computational cost  ATPG is a very challenging task  Exponential complexity  Circuit sizes continue to increase (Moore’s Law) –Aggravate the complexity problem further  Higher clock frequencies –Need to test for both structural and delay defects

EE141 VLSI Test Principles and Architectures Test Generation 6 6 Conceptual View of ATPG  Generate an input vector that can distinguish the defect-free circuit from the hypothetically defective one

EE141 VLSI Test Principles and Architectures Test Generation 7 7 Fault Models  Instead of targeting specific defects, fault models are used to capture the logical effect of the underlying defect  Fault models considered in this chapter:  Stuck-at fault  Bridging fault  Transition fault  Path-delay fault

EE141 VLSI Test Principles and Architectures Test Generation 8 8 Simple illustration of ATPG  Consider the fault d/1 in the defective circuit  Need to distinguish the output of the defective circuit from the defect-free circuit  Need: set d=0 in the defect-free circuit  Need: propagate effect of fault to output  Vector: abc=001 (output = 0/1)

EE141 VLSI Test Principles and Architectures Test Generation 9 9 Example 1 a b c d e f 1 0 g h i 1 s-a-0 j k z 0(1) 1(0) 1 Test vector for h s-a-0 fault Good circuit value Faulty circuit value

EE141 VLSI Test Principles and Architectures Test Generation 10 A Typical ATPG System  Given a circuit and a fault model  Repeat  Generate a test for each undetected fault  Drop all other faults detected by the test using a fault simulator  Until all faults have been considered  Note 1: a fault may be untestable, in which no test would be generated  Note 2: an ATPG may abort on a fault if the resources needed exceed a preset limit

EE141 VLSI Test Principles and Architectures Test Generation 11 Category of ATPG  Simulation-based Exhaustive Random-pattern generation Pseudo-random-pattern generation  Path sensitization D-algorithm, 9-V algorithm PODEM, FAN TOPS, SOCRATES  Boolean satisfiability & Neural network Boolean difference Boolean satisfiability (2-SAT, 3-SAT) Neural network

EE141 VLSI Test Principles and Architectures Test Generation 12 Random Test Generation  Simplest form of test generation  N tests are randomly generated  Level of confidence on random test set T  The probability that T can detect all stuck-at faults in the given circuit  Quality of a random test set highly depends on the underlying circuit  Some circuits have many random-resistant faults

EE141 VLSI Test Principles and Architectures Test Generation 13 Weighted Random Test Generation  Bias input probabilities to target random resistant faults  Consider an 8-input AND gate  Without biasing input probabilities, the prob of generating a logic 1 at the gate output = (0.5) 8 =  If we bias the inputs to 0.75, then the prob of generating a logic 1 at the gate output = (0.75) 8 =  Obtaining an optimal set of input probabilities a difficult task  Goal: increase the signal probabilities of hard-to-test regions

EE141 VLSI Test Principles and Architectures Test Generation 14 Exhaustive Test Generation  Exhaustive Testing  Apply 2 n patterns to an n-input combinational circuit under test (CUT)  Guarantees all detectable faults in the combinational circuits are detected  Test time maybe be prohibitively long if the number of inputs is large  Feasible only for small circuits  Pseudo-exhaustive Testing  Partition circuit into respective cones  Apply exhaustive testing only to each cone  Still guarantees to detect every detectable fault based on Lemma 1

EE141 VLSI Test Principles and Architectures Test Generation 15 Path Sensitization Method Circuit Example 1 Fault Sensitization 2 Fault Propagation 3 Line Justification

EE141 VLSI Test Principles and Architectures Test Generation 16 Path Sensitization Method Circuit Example  Try path f – h – k – L blocked at j, since there is no way to justify the 1 on i 1 0 D D D D D

EE141 VLSI Test Principles and Architectures Test Generation 17  Try simultaneous paths f – h – k – L and g – i – j – k – L blocked at k because D-frontier (chain of D or D) disappears 1 D D D D D 1 1 Path Sensitization Method Circuit Example

EE141 VLSI Test Principles and Architectures Test Generation 18  Final try: path g – i – j – k – L – test found! 0 D D D 1 D D Path Sensitization Method Circuit Example

EE141 VLSI Test Principles and Architectures Test Generation 19 History of Algorithm Speedups

EE141 VLSI Test Principles and Architectures Test Generation 20 Roth’s 5-Valued and Muth’s 9-Valued

EE141 VLSI Test Principles and Architectures Test Generation 21 Forward Implication  Results in logic gate inputs that are significantly labeled so that output is uniquely determined  AND gate forward implication table:

EE141 VLSI Test Principles and Architectures Test Generation 22 Backward Implication  Unique determination of all gate inputs when the gate output and some of the inputs are given

EE141 VLSI Test Principles and Architectures Test Generation 23 Example 2 Fault A sa0  Step 1 – D-Drive – Set A = 1 D 1 D

EE141 VLSI Test Principles and Architectures Test Generation 24 Step 2 -- Example 2  Step 2 – D-Drive – Set f = 0 D 1 0 D D

EE141 VLSI Test Principles and Architectures Test Generation 25 Step 3 -- Example 2  Step 3 – D-Drive – Set k = 1 D 1 0 D D 1 D

EE141 VLSI Test Principles and Architectures Test Generation 26 Step 4 -- Example 2  Step 4 – Consistency – Set g = 1 D 1 0 D D 1 D 1

EE141 VLSI Test Principles and Architectures Test Generation 27 Step 5 -- Example 2  Step 5 – Consistency – Set f = 0 D 1 0 D D 1 D 1

EE141 VLSI Test Principles and Architectures Test Generation 28 Step 6 -- Example 2  Step 6 – Consistency – Set c = 0, Set e = 0 D 1 0 D D 1 D 1 0 0

EE141 VLSI Test Principles and Architectures Test Generation 29 Test found -- Example 2  Step 7 – Consistency – Set B = 0 n Test cube: A, B, C, D, e, f, g, h, k, L D 1 0 X D D 1 D

EE141 VLSI Test Principles and Architectures Test Generation 30 Example 3 – Fault s sa1  Primitive D-cube of Failure 1 D sa1

EE141 VLSI Test Principles and Architectures Test Generation 31 Example 3 – Step 3 s sa1  Propagation D-cube for v 1 D 0 sa1 D 1 D

EE141 VLSI Test Principles and Architectures Test Generation 32 Example 3 – Step 4 s sa1  Propagation D-cube for Z 1 D sa1 0 D D D

EE141 VLSI Test Principles and Architectures Test Generation 33 Example 3 – Step 5 s sa1  Singular cover of m 1 D sa1 0 D D D 1

EE141 VLSI Test Principles and Architectures Test Generation 34 Test Found – Step 6 s sa1  Singular cover of d 1 D sa1 0 D D D 1 1

EE141 VLSI Test Principles and Architectures Test Generation 35 Example 3 – Fault u sa1  Primitive D-cube of Failure 1 D 0 sa1

EE141 VLSI Test Principles and Architectures Test Generation 36 Example 3 – Step 2 u sa1  Propagation D-cube for v and implications 1 D 0 sa1 D

EE141 VLSI Test Principles and Architectures Test Generation 37 Example 3 – Step 3 u sa1  Propagation D-cube for Z 1 sa1 D 0 D 0 1 D

EE141 VLSI Test Principles and Architectures Test Generation 38 Example 3 – Step 4 u sa1  Singular cover for r – f = 0 and n = 1 cannot justify r = 1 1 sa1 D 0 D 0 1 D

EE141 VLSI Test Principles and Architectures Test Generation 39 Example 3 – Backtrack  Remove C = 1 and B = 0 assignments 1 sa1 D 0

EE141 VLSI Test Principles and Architectures Test Generation 40 Example 3 – Backtrack  Need alternate propagation D-cube for v 1 sa1 D 0

EE141 VLSI Test Principles and Architectures Test Generation 41 Example 3 – Step 5 u sa1  Propagation D-cube for v 1 sa1 D 0 1 D

EE141 VLSI Test Principles and Architectures Test Generation 42 Example 3 – Step 6 u sa1  Propagation D-cube for Z and implications D 1 sa1 D 0 1 D

EE141 VLSI Test Principles and Architectures Test Generation 43 Example 3 – Step 7 u sa1  Singular cover for r sa1 D 1 D 0 1 D

EE141 VLSI Test Principles and Architectures Test Generation 44 Test Found – Step 8 u sa1  Singular cover for d – set A = 1 sa1 D 1 D 0 1 D

EE141 VLSI Test Principles and Architectures Test Generation 45 D-Algorithm – Top Level 1.Number all circuit lines in increasing level order from PIs to POs; 2.Select a primitive D-cube of the fault to be the test cube; Put logic outputs with inputs labeled as D (D) onto the D-frontier; 3. D-drive (); 4. Consistency (); 5.return ();

EE141 VLSI Test Principles and Architectures Test Generation 46 D-frontier  Fault Cone -- Set of hardware affected by fault  D-frontier – Set of gates closest to POs with fault effect(s) at input(s) Fault Cone D-frontier

EE141 VLSI Test Principles and Architectures Test Generation 47 Singular Cover Example  Minimal set of logic signal assignments to show essential prime implicants of Karnaugh map

EE141 VLSI Test Principles and Architectures Test Generation 48 D-Cube Operation of D-Intersection

EE141 VLSI Test Principles and Architectures Test Generation 49 Concluding Remarks  Covered a number of topics  Theoretical Foundations  Combinational & sequential ATPG  Untestable fault identification  Simulation-based & hybrid ATPG  Delay testing  Bridging fault testing  Compaction, N-Detect, FSM testing  Challenges Ahead  Fast untestable fault identification essential to remove large numbers of stuck-at, bridge, delay faults  Sequential ATPG remains an open research area

EE141 VLSI Test Principles and Architectures Test Generation 50 中科院研究生院课程： VLSI 测试与可测试性设计 下次课预告 时间： 2007 年 10 月 29 日（周一 7:00pm ） 地点： S106 室 内容：测试生成 (2) 教材： VLSI TEST PRINCIPLES AND ARCHITECTURES Chapter 4 Test Generation