On-The-Fly Mapping at AO: Sensitivity and Baseline Quality K. Spekkens, C. M. Springob, R. Giovanelli, M. P. Haynes, K. L. Masters; Cornell - Map 3 fields.

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Presentation transcript:

On-The-Fly Mapping at AO: Sensitivity and Baseline Quality K. Spekkens, C. M. Springob, R. Giovanelli, M. P. Haynes, K. L. Masters; Cornell - Map 3 fields in 4 ways: 1.DRIFT MODE: 12s/beam 2.“SLOW” OTF: 6s/beam 3.“FAST” OTF, RA-Dec: 3s/beam 4.“FAST” OTF, Dec-RA: 3s/beam - Setup and preliminary analysis: - L-narrow, MHz coverage (4x12.5 MHz BPs, 12 kHz ch.) - 1s integrations across ~5 min strips; Nyquist sampled beam - Bandpass correction: divide each record by strip average

Sensitivity Across a Strip – Drift vs. “Slow” OTF DRIFT“SLOW” OTF 1s integrations 1405 – 1415 MHz 1s int. + Hanning smooth in freq – 1419 MHz 1421 – 1425 MHz

Sensitivity Across a Strip – “Fast” OTF Dec-RARA-Dec 1s integrations 1405 – 1415 MHz 1s int. + Hanning smooth in freq – 1419 MHz 1421 – 1425 MHz

Baseline Quality – “Fast” OTF Dec-RA Map Raw spectrum: 1s integration 3s average: rms/beam 3s average + Hanning smooth Intensity (x T sys )

Baseline Quality – Power Spectrum Raw spectrum: 1s integration 3s average: rms/beam 3s average + Hanning smooth High freq.Low freq.

Baseline Quality – Average Power Raw spectrum: 1s integration 3s average: rms/beam 3s average + Hanning smooth High freq.Low freq.

OTF Mapping: Sensitivity and Baseline Quality For all methods (Drift, “slow” OTF, “fast” OTF): Theoretical sensitivity limit achieved; no trend in RMS across strip “Flat” baselines: no harmonics in power spectrum Map sensitivity and baseline quality independent of mapping technique

Baseline Quality – “Fast” OTF RA-Dec Map Raw spectrum: 1s integration 3s average: rms/beam 3s average + Hanning smooth Intensity (x T sys )

Baseline Quality – Power Spectrum Raw spectrum: 1s integration 3s average: rms/beam 3s average + Hanning smooth High freq.Low freq.

Baseline Quality – Average Power Raw spectrum: 1s integration 3s average: rms/beam 3s average + Hanning smooth High freq.Low freq.

Baseline Quality – “Slow” OTF Map Raw spectrum: 1s integration 6s average: rms/beam 6s average + Hanning smooth Intensity (x T sys )

Baseline Quality – Power Spectrum Raw spectrum: 1s integration 6s average: rms/beam 6s average + Hanning smooth High freq.Low freq.

Baseline Quality – Average Power Raw spectrum: 1s integration 6s average: rms/beam 6s average + Hanning smooth High freq.Low freq.

Baseline Quality – Drift Map Raw spectrum: 1s integration 12s average: rms/beam 12s average + Hanning smooth Intensity (x T sys )

Baseline Quality – Power Spectrum Raw spectrum: 1s integration 12s average: rms/beam 12s average + Hanning smooth High freq.Low freq.

Baseline Quality – Average Power Raw spectrum: 1s integration 12s average: rms/beam 12s average + Hanning smooth High freq.Low freq.

Baselines, 1s Integrations (Drift Map) time