doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 1 Systems Supporting Devices Under Test (DUTs) Mike Goettemoeller Texas Instruments – Santa Rosa, CA

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 2 Topics Overview Test platform –Issues –Mitigating Issues Conclusion

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 3 Overview The systems supporting the device under test for STAs – PCs, laptops, PDAs, VoIP/cell phones, etc can and will drastically affect the performance of the wireless device under test. Hardware Issues –Voltage regulation of device – the ability to supply the proper current necessary under heavy traffic conditions –Interference from the system supporting the DUT –Insufficient memory for buffering packets in high throughput situations Software Issues –For PCs and laptops, operating system must be able to support requirements (minimum RAM, CPU, etc) of the DUT

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 4 How does one isolate the DUT from the system supporting it? Assuring voltage regulation of system Assuring interference from system is negligible Assuring device has proper memory and correct OS to support device

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 5 Are there cases where it is not possible to isolate the system from the device it supports? For embedded devices such as cell phones/VoIP phones, it may be impossible to isolate the wireless subsystem without re- designing the entire system.

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 6 Will all tests run on all platforms? Forwarding rate tests may not be possible given the lack of sufficient memory in embedded devices.

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 7 Assuring Voltage Regulation Device performance can degrade if the regulation of the supporting system dips. Two ways to mitigate –Use an extender card (for pcmcia, mPCI) or cut supply lines (USB cable) and provide power via an external supply known capable of supplying proper regulation –Test system under heavy load to verify it can supply correct regulation

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 8 Example of Good/Bad Regulation

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 9 Testing System for Voltage Regulation Under Load To test the system under load, insert an extender card for pcmcia/mPCI slot or expose cable wires for USB to gain access to the supply lines. Step a potentiometer load across the terminals and measure the voltage/current supplied by the system. Once the specification current for the interface (mPCI, PCI, USB) has been met, stop the test. If the voltage regulation degrades with an increase in current, the system supply may be incapable of giving reliable results and an external supply should be used for wireless testing.

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 10 Alternative Method Insert the DUT in an extender card and put the device in near continuous transmit (streaming UDP). Transmission typically requires more current due to the power amplifier. Measure the voltage across the extender card supplying the DUT. If it dips greatly, it may be insufficient for the DUT. A similar method can be utilized for testing any other interface.

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 11 Can the System Generate RF Interference? The systems supporting the devices under test can generate RF interference which can inadvertently affect wireless performance This interference can come from embedded devices (mPCI in laptops), Bluetooth devices, or the laptop subsystems themselves. These RF ‘spurs’ can cause false packet detects, trigger CCA unnecessarily, etc

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 12 Laptop Interference Example

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 13 Laptop Interference Example (II)

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 14 Finding RF Noise Sources The obvious first step is to disable any RF devices , Bluetooth, etc. The next step is to determine if there is any RF interference being generated by the laptop, PC, etc. Using a spectrum analyzer, it is easy to scan the air surrounding the system and look for interference.

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 15 Mitigating RF Noise Sources The easiest method is to separate the DUT from the system – for USB, this is easy. A cable can be used isolating the DUT from the system. For pcmcia/mPCI, an extender card does an ok job to mitigate the effects. The level of interference decreases greatly with distance.

doc.: IEEE /1162r0 Submission September 2004 Mike Goettemoeller, Texas InstrumentsSlide 16 Conclusion In wireless testing, the systems supporting the DUTS can and do greatly affect the performance of the wireless devices. In non-embedded devices, it is necessary to mitigate the effects of the system to truly judge the wireless performance.