doc.: IEEE /0723r0 Submission July 2005 Fahd Pirzada - DellSlide 1 Data-oriented Usages Proposal for TGT Notice: This document has been prepared to assist IEEE It is offered as a basis for discussion and is not binding on the contributing individual(s) or organization(s). The material in this document is subject to change in form and content after further study. The contributor(s) reserve(s) the right to add, amend or withdraw material contained herein. Release: The contributor grants a free, irrevocable license to the IEEE to incorporate material contained in this contribution, and any modifications thereof, in the creation of an IEEE Standards publication; to copyright in the IEEE’s name any IEEE Standards publication even though it may include portions of this contribution; and at the IEEE’s sole discretion to permit others to reproduce in whole or in part the resulting IEEE Standards publication. The contributor also acknowledges and accepts that this contribution may be made public by IEEE Patent Policy and Procedures: The contributor is familiar with the IEEE 802 Patent Policy and Procedures, including the statement "IEEE standards may include the known use of patent(s), including patent applications, provided the IEEE receives assurance from the patent holder or applicant with respect to patents essential for compliance with both mandatory and optional portions of the standard." Early disclosure to the Working Group of patent information that might be relevant to the standard is essential to reduce the possibility for delays in the development process and increase the likelihood that the draft publication will be approved for publication. Please notify the Chair as early as possible, in written or electronic form, if patented technology (or technology under patent application) might be incorporated into a draft standard being developed within the IEEE Working Group. If you have questions, contact the IEEE Patent Committee Administrator at. Date: Authors: NameCompanyAddressPhone Fahd PirzadaDell One Dell Way Round Rock, TX Pratik MehtaDell One Dell Way Round Rock, TX Neeraj SharmaIntel Evening Creek Drive San Diego, CA Uriel Lemberger Intel PO Box 1659, Matam Industrial Park, Haifa Israel Sasha TolpinIntel PO Box 1659, Matam Industrial Park, Haifa Israel Nir AlonIntel PO Box 1659, Matam Industrial Park, Haifa Israel Amer HassanMicrosoft One Msft Way Richmond, WA

doc.: IEEE /0723r0 Submission July 2005 Fahd Pirzada - DellSlide 2 Introduction Key Requirements for defining a proposal – Test Environments/Conditions – Performance Metrics – Measurement Methodology – Correlation with end-user experience Usage + Environment Metrics Primary/Secondary Methodology Test Environment Test Procedure Test Template Analyze/Validate /Correlate Sep/Nov 2004 Meetings Jan/Mar 2005 Meetings May/Jul 2005 Meetings Internal review of TGT draft

doc.: IEEE /0723r0 Submission July 2005 Fahd Pirzada - DellSlide 3 Usage Case #1 - Updated 1. Data Oriented Applications + Home, Corporate Environment Chariot Throughput + Indoor, Chamber Environment Metrics: Throughput, Range (dB), Directionality Sub-Metrics.. noted on later slide Methodology: - Over the air testing in controlled environment - Conducted testing with Antenna Radiation Patterns Web Downloads + Indoor Environment Metrics: Latency, Throughput, Range Sub-Metrics Path loss, EVM measurements, Interference, Multipath, Noise, SNR, Receive sensitivity, Transmit power Methodology: ? File transfer + Indoor Environment Metrics: Throughput, Range (meters) Sub-Metrics SNR, Walls (Number, Construction) Methodology: LOS/NLOS, 1 AP to 1 STA, Minimal interference, Turn table Usage + Environment  Metrics  Methodology  … Case1: A Case1: B Case1: C

doc.: IEEE /0723r0 Submission July 2005 Fahd Pirzada - DellSlide 4 Contents of the Proposal Usage: Data Oriented Applications Test Environments: –Conducted Test Environment – doc.: /0660r0 –Over-the-air Test Environment – doc.: /0712r0 OTA Indoor LOS OTA Indoor NLOS OTA Outdoor LOS OTA in Shielded Enclosure Performance Metrics and Methodology: –Metrics for Conducted test environment – doc.: /0660r0 Conducted Throughput versus Attenuation Transmit Rate Adaptation Antenna Diversity –Metrics for OTA test environment – doc.: /0712r0 OTA Throughput versus Range OTA Throughput versus Attenuation

doc.: IEEE /0723r0 Submission July 2005 Fahd Pirzada - DellSlide 5 Next Steps Feedback from wider audience in TGT Proposal to incorporate in TGT draft Areas for further presentations on metrics Receiver Sensitivity Transmit Power EVM ACI Co-channel - Noise/Interference immunity n performance evaluation methodology