Summer '07 at CLS Small Angle X-Ray Scattering Peter ChenChithra Karunakaran & Konstantine Kaznatcheev

Purpose to provide an alternative imaging technique to STXM : to understand structural information of sample (Feser/Jacobsen) (Miao, Charalambous, Kirz, Sayre, Nature 400, 342 (1999))

Reconstruction image hologram diffraction pattern SEM image of letters, fabricated by gold dots, (100 nm in diameter each); diffraction pattern (middle) and reconstructed image (Miao, Charalambous, Kirz, Sayre, Nature 400, 342 (1999)). Only intensity is obtained, phase information is lost.

Purpose to image smaller samples Mie polar diagrams small x=  a/ large to test stability and integrity of the optics and the microscope

Tasks Tasks: create software determine camera setup in the STXM experimentation take data with respect to different variables orientation geometry nature of samples Andor Vacuum supported CCD. 512 x x 12.3 mm

Software Visual Basic.NET 2003 Requirements basic: single imaging, video, exposure settings, etc. long exposure aXis readable data and header output beamline read and control

Mechanics Implementation external placement

8 SAXS incident beam focus sample scattered wave 1 st order beam camera detector zone plate OSA

Scans on the Mesh x x x Exposure: 100 sec Energy: 710 eV

10 Change in Focus Defocusing of beam by 30 um by 10 um

Change in Energy Energy: 709 eVEnergy: 705 eVEnergy: 703 eV

Change in Slit Size 10 um x 10 um slit size 20 um x 20 um slit size50 um x 50 um slit size100 um x 100 um slit size

13 Consistency Iron Particles Exposure: 100 sec Energy: 710 eV Background Corrected 10 nm particle.

Camera Placement Issue