The LEO 1420VP Compact design ideal for small and medium sized samples Variable pressure operation at the click of a mouse Reduced sample preparation High performance electron optics Special Cryo port on chamber

LEO 1420VP Essential Specifications 3.5nm resolution @ 30kV (tungsten), 5.5nm resolution VP mode Tungsten or optional LaB6 firing unit Choice of solid state back scattered detectors Magnification range 15X to 300kX 200V to 30kV accelerating voltage with automatic EHT bias Unique Optibeam column control algorithm

LEO 1420VP Essential Specifications The LEO 32 and WindowsTM 98 or optional NT4.0 operating system 6 axis manual high precision eucentric goniometer stage Extensive annotation and measurement facilities 3072 x 2304 pixel image store with square pixels 3 built in ‘real time’ image processing modes

LEO 1420VP Key Features & Options 43mm x 25mm for smaller samples Medium travel stage Cylindrical chamber with EDS and cryo accessory ports User accounting software option setting preferences for new users and monitoring resources used, ideal in a multi user environment TIF file archive options industry standard Zip and CD read / write / re-write Printer options a choice of hardcopy options to present those images at a variety of cost and quality levels

LEO 1420VP Key Features & Options expanded desktop option allowing two applications to run together with the clarity of full screen imaging for both Second monitor options Analytical interface the convenience of a high performance EDS system merged completely within the SEM control software stage and SEM parameter control using rotary controls giving the SEM a more traditional feel Multi function control panel option