WIDE-FIELD IMAGING IN CLASSIC AIPS Eric W. Greisen National Radio Astronomy Observatory Socorro, NM, USA.

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Presentation transcript:

WIDE-FIELD IMAGING IN CLASSIC AIPS Eric W. Greisen National Radio Astronomy Observatory Socorro, NM, USA

URSI August 2002 Wide-field imaging in Classic AIPS The problem Non-coplanar array has w term in the equation for phase

URSI August 2002 Wide-field imaging in Classic AIPS Magnitude of the problem Approximation of worst phase error leads to limit on full facet diameter, all angles in same units. Note that synthesized beamwidth and single-dish beam size are both proportional to wavelength, making this limitation more serious at longer wavelengths.

URSI August 2002 Wide-field imaging in Classic AIPS The solution Left: single large field develops large phase errors away from the center Right: multiple small facets approximate the sphere with greatly reduced phase errors Requires re-computation of (u,v,w) and adjustment of visibility phases for each facet

URSI August 2002 Wide-field imaging in Classic AIPS Implementation details Imaging: rotate (x,y,z) of facet center by inverse matrix, rotate each (u,v,w) by forward matrix for gridding with phase shift by product of rotated vectors DFT component subtraction: (x,y,0) in facet rotated by forward matrix and then subtracted from input data Gridded component subtraction: rotate (x,y,z) of facet center by inverse matrix, rotate each (u,v,w) by forward matrix, subtract gridded model, rotate each (u,v,w) by inverse matrix before writing back out. Requires separate synthesized beam for each facet Cotton/Schwab/Clark Clean done one facet at a time “OVERLAP 2” mode: subtract the components of current facet before imaging and Cleaning next strongest facet

URSI August 2002 Wide-field imaging in Classic AIPS Usage SETFC: task to recommend cell and image sizes, placement of facets and default Clean windows CHKFC: task to make image of facets and Clean windows written by SETFC IMAGR: task to image and Clean the facets FLATN: task to regrid the facets from IMAGR and CHKFC onto a single image CALIB: task to improve the calibration of the data using the full model in the multiple facets Numerous other tasks use these models too

URSI August 2002 Wide-field imaging in Classic AIPS Costs and benefits Left: source phase corrected to facet center only Right: phases and (u,v,w) corrected for facet center shift. Both images Cleaned and displayed equally. Cost: 1 % in cpu when not needed, speeds Clean when it is needed Weighting best only for center facet

URSI August 2002 Wide-field imaging in Classic AIPS Example field VLA D array 20-cm wavelength continuum Observed with only 1 channel in 50 MHz, multiple narrower channels would be better Facet size rules allow a single facet to cover well beyond the half-power point of the single-dish beam pattern Imaged over a larger area of necessity – 19 central facets used plus one on a 3C source Data on Abell 2256 from Tracy Clarke and Torsten Ensslin

URSI August 2002 Wide-field imaging in Classic AIPS Facet selection illustrated Output of CHKFC after FLATN. The facet numbers are shown in the center of the default circular Clean windows. Note the large area covered – each facet covers ~40 arc minutes while the primary beam to half power is only 30. These facet centers and Clean windows are then used by IMAGR.

URSI August 2002 Wide-field imaging in Classic AIPS Why Clean the large area? Cleaned image, allowing Clean to find components only in the center facet. Note the sources farther out in the primary beam and in its first outer sidelobe (down ~18 db). The distant sources compromise the science on this cluster unless they are also imaged correctly.

URSI August 2002 Wide-field imaging in Classic AIPS Results if one does Same field Cleaned over all facets with OVERLAP 2 mode. The improvement in the main source area is considerable. The strong source in the outer sidelobe has been Cleaned rather well, but residual calibration, beam, and pointing effects remain.

URSI August 2002 Wide-field imaging in Classic AIPS Were 3D facets really needed? Single large facet imaged and Cleaned with no geometrical corrections. Note remaining unCleaned sidelobes and defects all of which are worse than in the 3D multiple-facet image. Note also several sources in the second outer sidelobe of the single-dish beam.

URSI August 2002 Wide-field imaging in Classic AIPS Multi-scale Clean IMAGR implements a multiple resolution form of Clean suggested by my ancient experiments and recent work by Holdaway & Cornwell. The multiple facets are used to Clean full resolution images of each facet with a point model plus tapered images of each facet with one or more Gaussian source component models. Cotton/Schwab Clean is used to subtract the model visibilities in the uv plane and then re-image. Various “steering” options are employed to reduce the tendency to favor the lowest resolution (since it integrates over the greatest flux).

URSI August 2002 Wide-field imaging in Classic AIPS Point versus multi-scale: Facet 1 Point-source model only Clean (left) leaves a negative “bowl” around and in the cluster due to absence of very short-spacing data. Multi-scale Clean (right) reduces this effect.

URSI August 2002 Wide-field imaging in Classic AIPS Point versus multi-scale: Full image Blue: facet image, Green: point image, Red: Multi-scale image Note: grating rings of inner “bowl” in point-model Clean

URSI August 2002 Wide-field imaging in Classic AIPS Summary All matters presented here should be well known, although imaging beyond the primary beam and multi- scale Clean require more study. Classic AIPS has made these algorithms available to a wide range of users on a variety of computers. Multiple facets with multiple source models are supported in all data modeling used in calibration, editing, and display. Multiple facets each tangent to the celestial sphere are a good way to solve the “3D” or non-coplanar array problem at surprisingly little cost. Wide-field imaging is needed at longer wavelengths to reduce the effects of interfering sources. Cleaning with multiple sizes of component model can reduce effects of missing short spacings and large diameter sources.