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Development of Ge JFETs for Deep-Cryogenic Preamplifiers SPIE - Astronomical Telescopes and Instrumentation Hawai’i, August 2002
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R. R. Ward and R. K. Kirschman GPD Optoelectronics Corp., Salem, New Hampshire, U.S.A. M. D. Jhabvala NASA Goddard Space Flight Center, Greenbelt, Maryland, U.S.A. R. S. Babu Ball Aerospace & Technologies Corp., Boulder, Colorado, U.S.A. D. V. Camin and V. Grassi Physics Department of the University and INFN, Milan, Italy
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ASTRO-E Preamp Assembly ~1.2 K ~120 K ~18 K
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The Problem Sensor at ~1 K, Preamplifier at ~100 K Long Wires –Parasitic capacitance and resistance –Microphonics –EMI pickup Heat Transfer to Sensor Extra Power Mechanical Complexity
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A Solution A Transistor That Can Operate at ~1 K
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A Solution A Transistor That Can Operate at ~1 K We Proposed the Ge JFET (Junction Field-Effect Transistor)
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Technical Goals for Ge JFETs Operate at Any Temperature, ~1 – 300 K Very Low Low-Frequency Noise –Equal to best Si JFETs at optimum temp (~120 K) High Input Resistance/Low Input Current Tailorable Input Capacitance Low Power Integrable Available, Standard and Custom
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Why Ge? Ge JFETs Operate Well to Lowest Temperatures (~1 K) Both n-Channel and p-Channel JFETs Texas Instruments Ge JFET Ge Is an Elemental Semiconductor Ge Technology Is Sufficiently Developed
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Ge JFET Cross-Section (n-channel)
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~1 mm Ge JFETs
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Conduction vs Temperature
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DC Characteristics
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DC Characteristics - 4 K
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DC Characteristics
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Noise Characteristics
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Noise Voltage - 77 K
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Noise Voltage vs Power - 77 K
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Noise Voltage vs Temperature
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Noise Voltage - 4 K
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Summary Successfully Fabricated Ge JFETs, n- and p-Channel Provided Evaluation Ge JFETs to Potential Users DC Characteristics Good at All Temperatures down to 4 K Turn-On Threshold at 4 K (T<~20 K) Achieved Low Noise down to ~30 K Noise Higher than Desired at 4 K
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Plans Adjust Parameters to Extend Low Noise to ~1 K Reduce Noise at All Cryogenic Temperatures –Match that of Si JFETs at higher temperature For Both n- and p-Channel
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