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Drift property in non-uniform B field. T.Sawada June 18, 2004
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Electron drift in E and non-uniformed B field Drift velocity of electron in E, B field (Langevin equation) First order Runge-Kutta integration was applied
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Strategy of correction 1.Determine by the data of B=0 (vd=5cm/usec). 2.Execute Runge-Kutta intergration in non- uniform B
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Run # 28911 (CR) before correction Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 Layer-dependence of resZ Layer ( at -1400 < z < -1300 ) resZ (mm) Z-dependence of resZ Z (mm)
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Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( -1400 < z < -1300 ) Run # 28911 (CR) before correction resZ (mm) Layer = 0Layer = 1
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Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( -1400 < z < -1300 ) Run # 28911 (CR) before correction resZ (mm) Layer = 2Layer = 3
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Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( -1400 < z < -1300 ) Run # 28911 (CR) before correction resZ (mm) Layer = 4Layer = 5
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Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( -1400 < z < -1300 ) Run # 28911 (CR) before correction resZ (mm) Layer = 6Layer = 7
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Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( -1400 < z < -1300 ) Run # 28911 (CR) before correction resZ (mm) Layer = 8Layer = 9
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Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( -1400 < z < -1300 ) Run # 28911 (CR) before correction resZ (mm) Layer = 10Layer = 11
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Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( -1400 < z < -1300 ) Run # 28911 (CR) before correction resZ (mm) Layer = 12Layer = 13
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Run # 28911 (CR) after correction Z (mm) resZ (mm) Layer ( at -1400 < z < -1300 ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 Layer-dependence of resZ Z-dependence of resZ
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resZ (mm) Layer = 0Layer = 1 Run # 28911 (CR) after correction Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4 ( -1400 < z < -1300 )
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resZ (mm) Layer = 2Layer = 3 Run # 28911 (CR) after correction ( -1400 < z < -1300 ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4
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resZ (mm) Layer = 4Layer = 5 Run # 28911 (CR) after correction ( -1400 < z < -1300 ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4
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resZ (mm) Layer = 6Layer = 7 Run # 28911 (CR) after correction ( -1400 < z < -1300 ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4
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resZ (mm) Layer = 8Layer = 9 Run # 28911 (CR) after correction ( -1400 < z < -1300 ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4
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resZ (mm) Layer = 10Layer = 11 Run # 28911 (CR) after correction ( -1400 < z < -1300 ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4
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resZ (mm) Layer = 12Layer = 13 Run # 28911 (CR) after correction ( -1400 < z < -1300 ) Cut condition: chi2Pad > 0.02, chi2Z > 0.02, -0.4 < lambda (dip angle) <0.4
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Summary The Mean Value of the residual of Layer(5 ~ 13) aprroached almost 0 !! ( Correction of Layer(0 ~ 1) is parhaps needed consideration of non-uniformity of the electronic field around Target-holder. ) I intend to study the following in future : > improvement of resZ of Layer(0 ~ 4) > Z-dependance of resZ.
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