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Published byNorah Palmer Modified over 8 years ago
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Sohail Musa Mahmood on behalf of SAMPA team and Norwegian group SAMPA linearity test results SAMPAmeeting 11.03.2015
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Gain and Peaking time Setup configuration Connecting a small capacitance in series with the input cable. Applying an input signal (square wave, ramp up/down, exponential rise/fall ). Connecting the input signal directly to the detector pads. Setting the configuration of the analog chip. Observe the differential output at the corresponding channel.
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Setup configuration
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Gain Results
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30mV/fC@160 ns - Linearity
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20mV/fC@160 ns - Linearity
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30mV/fC@160 ns (pos) – Linearity – all channels
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30mV/fC@160 ns (pos) – Linearity – mean value
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30mV/fC@160 ns (pos)- Linearity INL
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30mV/fC@160 ns (neg) – Linearity All channels
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30mV/fC@160 ns – Linearity INL – ALL CHANNELS
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30mV/fC@160 ns (neg) – Linearity MEAN
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30mV/fC@160 ns (neg) – Linearity MEAN - INL
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20mV/fC@160 ns (pos) – Linearity ALL channels
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20mV/fC@160 ns (pos) – Linearity MEAN
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20mV/fC@160 ns (pos) – Linearity MEAN - INL
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20mV/fC@160 ns (neg) – Linearity ALL channels
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20mV/fC@160 ns (neg) – Linearity MEAN
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20mV/fC@160 ns (neg) – Linearity MEAN - INL
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Conclusion Linearity seems to be good. Some issues with the desired gain. More oscillations on channel 1 than other channels. (tested 2 chips) Some more linearity results for the chip 3 analog part (only for positive configurations)
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On going work and future plans Analysing the results for statistical linearity measurements. Preparing the setup for first irradition tests of SAMPA MPW1. Single-Event Latchup tests on all 3 chips and Single Event Upset tests on shift registers (chip 3). Planning to perform the first irradiation tests in the end of april in Uppsala (together with RCU2 testing).
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Thank you for your attention. Any questions ?
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