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FMEDA of the Fast Beam Interlock System Riccard Andersson Machine Protection Review 2015-12-09
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The Beam Interlock System 2
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Failure Modes, Effects, and Diagnostics Analysis Greatly inspired by Ben et al.’s analysis for LHC One FMEDA per module – Gives overall failure rate, per failure mode ReliaSoft BlockSim for system-level calculation Analysis Approach Input Signal (BLM, BCM etc) FBI_DFBI_DIFFBI_MASTERFBI_ACTUATOR Actuators (Choppers, PS) 3
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Analysis Approach Military Handbooks (MIL-HDBK-217F and 338B) Component manufacturer documentation System Effects are – Negligible – Maintenance – Trip – Blind – To Be Tested (TBT) 4 Detection ways are – Hidden – Inspection – Diagnostics – Test
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Failure Sheet – Excerpt from FBI_DIF 5 THICK FILM RESISTOR 27.17 Open Circuit0.5916.03TripDiagnostics R4_TTest100 OHM, 125mWFarnell163245627.179.2Value Drift0.369.78NegligibleHidden 150 V27.17Short Circuit0.051.36TripDiagnostics Surface Mount Thick Film Resistor 27.17 Open Circuit0.5916.03NegligibleHidden R5_TTest MCWR Series, 1 kohmFarnell244758727.179.2Value Drift0.369.78NegligibleHidden 125 mW, ± 1%, 150 V27.17Short Circuit0.051.36TripTest Surface Mount Thick Film Resistor 27.17 Open Circuit0.5916.03TripDiagnostics R2_PPermit20 kohm, 125 mWFarnell244760327.179.2Value Drift0.369.78NegligibleInspection 150 V27.17Short Circuit0.051.36TripDiagnostics Surface Mount Thick Film Resistor 27.17 Open Circuit0.5916.03TripDiagnostics R3_PPermit20 kohm, 125 mWFarnell244760327.179.2Value Drift0.369.78NegligibleInspection 150 V27.17Short Circuit0.051.36NegligibleInspection IC, INVERTING SCHMITT TRIGGER 264.70 Fails Low0.5132.35TripTest U5_TTest5 pins, 2/6 VFarnell1468757264.705.1Fails High0.5132.35TripDiagnostics Trip at TestNo EffectMaintenanceTripBlindTo Be TestedSum16863.48 1676.856571.141743.428084.61372.5791.74 Color coded cells for quick overview – System Effect and Detection NameLocationDescriptionSupplierSupplier IDComponent Failure RateReferenceFailure ModeRatioMode Failure RateSystem EffectDetection [1/1E9 hours]MIL-HDBK-217FMIL-HDBK-338B [1/1E9 hours]Blind, TripTest, Diagnostics Sheet:Calculator Maintenance, NegligibleInspection, Hidden
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Hardware Draft Results 6 Failure rate per hour versus design prototype 15% of PIL2 DRAFT
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Hardware Draft Results (extended) A few more design options 7 15% of PIL2 DRAFT
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Reliability Beam trip allocation from RAMI group 8 50 per year for all of ICS 34 per year from BIS only DRAFT
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Summary and Discussion Points Trade off between – Protection Function Highest is a PIL2 PF – Reliability “95% user happiness” Expand the analysis to – Monitor inputs (BCM, BLM, BPM) – Actuators How to include e.g. firmware and operational errors? Reliability analysis without complete schematics 9
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Thank You 10
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PROTECTS THIS MACHINE
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