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Yonsei University 나노분석기술의 현재와 미래 - 국소프로브법을 중심으로 한 실리콘표면 응용 염 한 웅 연세대학교 물리학과 / 원자선원자막연구단
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Yonsei University
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Contents Part I - “Nano Probing” Part II - “Nano Probing Atomic Wires”
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Yonsei University Part I “Nano Probing”
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Yonsei University Contents of Part I I.What is nano-probes ? II.Nano-probes based on x-ray - frontiers and status III. Nano-probes based on scanning probes - frontiers and status
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Yonsei University What we need
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Yonsei University What we have
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Yonsei University Let’s focus on nano
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Yonsei University 나노분석기술 - Nano Probing Electron Beam Ion Beam Hard X-raySoft X-ray Probe
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Yonsei University Photon beam ( 빛 ) probe UPS - 전자구조 XPS - 원소분석 화학결합 XRD - 결정구조 EXAFS - 국소구조
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Yonsei University How to nano-focus x-ray SEM image ZP Fresnel zone plate (ZP)
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Yonsei University High-brightness source: synchrotron radiation NNNSSS NNNSSS High Flux Undulator Source
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Yonsei University 국내기반 - Pohang Light Source from 1993
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Yonsei University STM
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Yonsei University Our lab for STM ~ 20 K ~ 0.4 K / 7 T
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Yonsei University STM/AFM can see and touch atoms D. Eigler, IBM (2000) S. Morita, Osaka Univ (2005)
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Yonsei University R. Wiesendanger, Univ Hamburg (2000-2004) STM can see the spins of atoms
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Yonsei University STM probes more on nano…
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Yonsei University STM probes more on nano and further Electronic states Optical properties Phys. Rev. Lett. (2000-2003) Magnetic properties Science (2006)
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