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Topic Report Photodetector and CCD
Tuan-Shu Ho Add a lambda^2 in the interpolation process Laser diode = 2:15
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Introduction Photodetector CCD (Charge-coupled device) CMOS
Photodiode: photon > electron Thermocouples photon > heat > electron CCD (Charge-coupled device) CMOS CCD camera Photodetector
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Basic Principle of Photodiode
Reverse biased PN or PIN diode Material (i.e. Si) absorbs photon, and generating electron (current) by photoelectric effect Avalanche photodiode (APD) with a built-in first stage of gain through avalanche multiplication photodiode Avalanche photodiodes
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Basic Principle of CCD Composed with pixels
Pixel: photoactive element Exposure: charge generated by photoelectric effect Photocharge is stored in the pixel before readout Readout Charge is moved by shift register Output to Charge amplifier EECCD
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Feature of Photodetector
Responsibility & Noise Bandwidth Responsibility and noise determine the signal to noise ratio (SNR). Bandwidth time limits the temporal resolution Tradeoff: SNR and temporal resolution
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Responsibility Responsibility of a photodetector: electrical output per optical input A/W: ampere per watt Quantum efficiency: # of e- / # of photon Material dependent Silicon (<1100nm), Ge, InGaAs … etc. A/W of Thorlabs PDA36A QE of e2v EM4 CCD
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Noise of Photodiode Thermal noise Electronic noise
Thermal-generated electrons > dark current Electronic noise The noise generated in the circuit (i.e. amplifier) Higher responsibility reduces the effect of electronic noise to the signal Noise-equivalent power (NEP): It is defined as the optical signal power that gives a SNR of 1 in a 1Hz output bandwidth. State-of-the-art: ~1fW/Hz0.5 (10-15W/Hz0.5, APD) Avalanche Photodiode
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Bandwidth of Photodetector
Limit by RC time constant of circuit and charge collection time State-of-the-art: hundreds of GHz Gain-bandwidth product Bandwidth ↓ as gain ↑ NEP ↓ as gain ↑
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Noise of CCD Operation of CCD
Exposure Readout by shift register charge amplifier Saturation: the photo-charge is accumulated in each pixel between readout Well depth: How many e- can be stored in a pixel Readout noise: the amplifier noise Dynamic range: max. / min. optical power (noise) Typical: 30~40dB State-of-the-art: ~60dB (Andor EMCCD)
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Speed of CCD The “bandwidth“ of CCD is limited by the readout time
The time required to read a whole line (with N pixel, N= 256, 512, 1024, 2046, 4096 … etc.) The readout time ↑ as number of pixels ↑ The readout time ↑ as pixel size ↑ The larger the pixel size, the larger the well depth Typical pixel size: >10micron Typical: tens of ns/pixel > hundred of MHz Compare to hundred of GHz of photodiode
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EMCCD Andor iXon3 897 EMCCD Pixel number: 512 x 512
Pixel size: 16 x 16 micron Frame rate: 4~40fps Digitization: 16bit Well depth: 800,000 e- Noise level: 4fps: 21 e- 20fps: 49 e- With Electron Multiplication ON: <1 e-
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e2v EM4 Pixel number: 4096 x 1 Pixel size: 10 x 10 micron
Line rate: <30kHz Digitization: 12bit Well depth: 117,500 e- Noise level: 43 e-
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Summery The performance of photodiode is better than CCD.
Larger the bandwidth Higher the saturation power, larger the dynamic range Noise CCD offers special features like: Detector array Application in imaging and spectroscopy
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