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Sushovit Adhikari, Sanichiro Yoshida and Kenji Gomi* Dept of Chemistry and Physics, Southeastern Louisiana University *Present address: Dept. of Mech Eng. Tokyo Denki University
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Outline Existing quality control tests and their shortcomings Preliminary research Instrument design Qualitative and Quantitative analysis of thin film samples
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Existing Quality Control Tests Non Destructive Full Field GHz Imaging Technique (expensive and complicated) Scanning Acoustic Spectroscopy [V(z) method] (time consuming) Destructive Nano Scratching Nano indentation (They are not good for 100% inspection)
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Preliminary Research Thin film samples were oscillated with an acoustic transducer from the rear A vibrometer was used to measure surface displacement in thin film samples. O 2 treated and untreated thin film samples were measured
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Results Reference M. Basnet, S. Yoshida, B. R. Tittmann, A. K. Kalkan, and C. Miyasaka, “Quantitative Nondestructive Evaluation for Adhesive Strength at an Interface of a Thin Film System with Opto-Acoustic Techniques”, 47 th Annual Technical Meeting of Society of Engineering Science, Oct 4-6, Iowa State University, Ames, IA (2010)
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Experimental Setup
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Qualitative Analysis 11.5 kHz (transducers off) 11.5 kHz (treated transducer on) 11.5 kHz (Untreated transducer on) Fig: Fringe patterns for untreated and treated specimens independently driven at 11. 5 kHz compared with that when both transducers were off
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Thin Film Samples (pixel vs intensity) untreated
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Fourier Transform of Thin Film Samples untreated
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Fourier Transform Peak Level untreated
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Conclusions Existing Quality Control Tests are Insufficient An Effective Quality Control Test Should be Nondestructive and Affordable Instrument was assembled to test the adhesive Strength Qualitative Analysis Revealed a Correlation Between Fringe Contrast and Adhesive Strength of the Thin Film Samples. A Method of Quantitatively Analyzing the Fringe Contrast was Developed
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Acknowledgements Southeastern Louisiana University STAR grant Dr. Chiaki Miyasaka, Pennsylvania State University Dr. Ik-Keun Park, Seoul National University of Science and Technology
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