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Professor Ronald L. Carter ronc@uta.edu http://www.uta.edu/ronc/
EE Semiconductor Electronics Design Project Spring Lecture 07 Professor Ronald L. Carter L07 February 05
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Lab schedule As announced last week, plan to attend your lab session (Tu or Th at 230 to 500 PM) this week for additional Cadence instruction. Topics to be covered schematic capture of a circuit making a symbol simulating a circuit L07 February 05
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Bipolar junction transistor (BJT)
General bias on a pnp transistor The BJT is a ‘silicon sandwich’ p+np- or n+pn- npn For. Active BJT action when VBE > 0 and VBC < 0 p n E B C VEB VCB Charge neutral Region Depletion Region L07 February 05
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npn BJT currents (F A region, ©RLC)
IC = JCAC IB=-(IE+IC ) JnE JnC IE = -JEAE JRB=JnE-JnC JpE JGC JRE JpC L07 February 05
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Ebers-Moll (npn injection model)
(common-emitter) E L07 February 05
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E-M model equations L07 February 05
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Ebers-Moll Model (npn bipolar jctn. tran. w/o inj.)
aRIR aFIF E C (Common base) B L07 February 05
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IC npn BJT (*Fig 9.2a) L07 February 05
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npn BJT regions of operation
VBC Reverse Active Saturation VBE Forward Active Cutoff L07 February 05
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npn FA BJT minority carrier distribution (Fig 9.4*)
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npn RA BJT minority carrier distribution (Fig 9.11a*)
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npn cutoff BJT min carrier distribution (Fig 9.10a*)
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npn sat BJT minority carrier distribution (Fig 9.10b*)
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Defining currents in FA mode npn BJT (Fig 9.13*)
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Non-ideal effects in BJTs
Base-width modulation (FA: xB changes with changes in VBC) Current crowding in 2-dim base High-level injection (minority carriers g.t. dopant - especially in the base). Emitter Bandgap narrowing for NE --> density of states at cond. band. edge Junction breakdown at BC junction L07 February 05
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npn Base-width modulation (Early Effect)
Fig 9.15* L07 February 05
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Base-width modulation (Early Effect, cont.)
Fig 9.16* L07 February 05
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Emitter current crowding in base
Fig 9.21* L07 February 05
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Interdigitated base fixes emitter crowding
Fig 9.23* L07 February 05
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Effect of HLI in npn base region
Figs 9.18 and 9.19* L07 February 05
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Ebers-Moll Model (Neglecting G-R curr)
(Fig. 9.30*) L07 February 05
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Hybrid-pi Circuit model
Fig 9.33 Semiconductor Physics and Devices, 2nd ed., by Neamen, Irwin, Boston, 1997. L07 February 05
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Hybrid-pi circuit model
Adapted from inj. model version of E-M model with parasitic rb, rc, re, and CSubst C-E branch is linking current B-E branch is the reduced B-E diode with diffusion (for and rev) resistance and capacitance and junction cap. B-C branch is the reduced B-C diode with diffusion (for and rev) resistance and capacitance and junction cap. L07 February 05
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References * Semiconductor Physics & Devices, by Donald A. Neamen, Irwin, Chicago, 1997. L07 February 05
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