Download presentation
Presentation is loading. Please wait.
Published byRobert Reeves Modified over 8 years ago
1
MOSFETs: Drain Voltage Effects on Channel Current Prof. Paul Hasler
2
Origin of Drain Dependencies Increasing Vd effects the drain-to-channel region: increases depletion width increases barrier height
3
Drain Characteristics
4
Current versus Drain Voltage
6
Not flat due to Early effect (channel length modulation)
7
Current versus Drain Voltage Not flat due to Early effect (channel length modulation) In BJTs --- Base Modulation Effects
8
Current versus Drain Voltage Not flat due to Early effect (channel length modulation) I d = I d (sat) (1 + (V d /V A ) ) or I d = I d (sat) e Vd/VA In BJTs --- Base Modulation Effects
9
Current versus Drain Voltage Not flat due to Early effect (channel length modulation) I d = I d (sat) (1 + (V d /V A ) ) or I d = I d (sat) e Vd/VA R out I d (sat) GND I out In BJTs --- Base Modulation Effects
10
Early Voltage Length Dependence Width of depletion region depends on doping, not L Might expect Vo to linearly vary with L
11
Full Range of Effects 0 1 2 3 4 5 6 7 012345678910 1 100 Punchthrough Current (nA) Voltage (V) Exp model Slow / Exponential Increase: Channel Modulation / DIBL Effect Other (faster) effects: Punchthrough --- depletion regions converge Avalanche Breakdown --- impact ionization (Punchthrough voltage = 2 * V A ) V A = 5V
12
Cause of DIBL
13
Drain Induced Barrier Lowering Data taken from a popular 1.2 m MOSIS process Data taken from a popular 2.0 m MOSIS process
14
Different Manifestations of DIBL
16
Drain Voltage Effects Channel Length Modulation / Early Effect Exponential Modeling Drain Induced Barrier Lowering (DIBL): Source of Exponential I-V dependence Punchthrough: Highest Drain-Source voltage available
Similar presentations
© 2025 SlidePlayer.com. Inc.
All rights reserved.