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THEMIS Instrument CDR 1 UCB, April 20, 2004 Actel Reliability Critical Design Review Robert Abiad University of California - Berkeley
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THEMIS Instrument CDR 2 UCB, April 20, 2004 Actel Overview Overview of Actel SX-S Field Programmable Gate Array 2012 flip-flops 4024 combinatorial modules 5V I/O supply 2.5V internal supply >200 MHz performance Output 400-500 ps rise time for commercial part Output 2 ns low-slew fall time for commercial part
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THEMIS Instrument CDR 3 UCB, April 20, 2004 Actel Difficulties Metastability Violation of flip-flop setup time resulting in undefined output Solution - Add another synchronizing flip-flop
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THEMIS Instrument CDR 4 UCB, April 20, 2004 Actel Difficulties Glitch Sensitivity Flip-flops respond to ns glitches Solution - Sample clock input where glitches will create failures
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THEMIS Instrument CDR 5 UCB, April 20, 2004 Actel Difficulties Power On Reset Can cause timing violations if removed asynchronously to flip- flop inputs. Solution - Assert asynchronously, but de-assert synchronously
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THEMIS Instrument CDR 6 UCB, April 20, 2004 Actel Difficulties Clocks Only HCLK is absolutely guaranteed Use as main clock CLKA/CLKB are susceptible to too much skew Use with caution QCLKA/B/C/D are guaranteed in their quadrants but not outside Use with caution Unused clocks must be grounded.
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THEMIS Instrument CDR 7 UCB, April 20, 2004 Actel Difficulties Timing Analysis Must be done Easiest when design is synchronous Less repeatable when the part is closer to full.
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THEMIS Instrument CDR 8 UCB, April 20, 2004 Actel Difficulties Ground Bounce The momentary difference between the ground inside an IC and on a PCB caused by the transition of I/Os on the IC to ground. The result of inductance between the IC ground and the PCB. Can cause receiving flip-flops to clock. Can temporarily increase the array voltage on Actels and destroy antifuses. Solutions Separate simultaneously switching I/Os Provide the shortest path to ground as possible for parts Use low slew outputs on Actel pins Install resistors in series with signals that may glitch
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THEMIS Instrument CDR 9 UCB, April 20, 2004 Actel Difficulties Power Decoupling Best to have a mix of decoupling capacitor sizes (100nF, 10nF, 1nF) Use short, fat traces Utilize interplane capacitor
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THEMIS Instrument CDR 10 UCB, April 20, 2004 Actel Difficulties Signal Integrity Fast signals on long traces ring - use termination Signals that travel near each other talk Separate sensitive signals Route traces in opposite directions on adjacent layers Slow signals down - low slew or series termination Keep a reference plane adjacent to signal layers Clock edges need to be just right Slow edges cause multiple transitions Fast edges create noise Stubs increase noise - don’t use on sensitive signals
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