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CMOS Fabrication EMT 251
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Objectives To discussed the fundamentals of CMOS fabrication steps.
To examined the major steps of the process flow. To overview the cross section view of a circuit
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Chip making Process
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Introduction MOSFET PMOS NMOS CMOS
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MOSFET Metal Oxide Semiconductor Field Effect Transistor
Source Drain Gate Metal Oxide Semiconductor Field Effect Transistor Source (Arsenic, Phosphorous, Boron) Drain (Arsenic, Phosphorous, Boron) Gate (Aluminum, Polysilicon) MOSFET
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NMOS P-type substrate N-type dopant for Source & Drain
Inversion layer is formed to conduct electricity
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NMOS P-type substrate N-type dopant for Source & Drain
Inversion layer is formed to conduct electricity
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PMOS N-type substrate P-type dopant for Source & Drain
Inversion layer is formed to conduct electricity
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PMOS N-type substrate P-type dopant for Source & Drain
Inversion layer is formed to conduct electricity
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CMOS A combination of both NMOS & PMOS technology
Most basic example: inverter
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PROCESS FLOW WELL FORMATION ISOLATION FORMATION TRANSISTOR MAKING
INTERCONNECTION PASSIVATION
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CMOS FABRICATION PROCESS well formation
Start with clean p-type substrate (p-type wafer)
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CMOS FABRICATION PROCESS well formation
Grow epitaxy layer (made from SiO2) as mask layer for well formation
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CMOS FABRICATION PROCESS well formation
Well will be formed here By *photolithography and etching process, well opening are made *photolithography and etch processes are shown in next slides
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Photolithography (CED)
photoresist Photoresist coating (C) Masking and exposure under UV light(E) Resist dissolved after developed (D) Pre-shape the well pattern at resist layer Si02 P-substrate UV light mask Opaque area P-substrate Transparent area
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etching Removing the unwanted pattern by wet etching Resist clean
Desired pattern formed P-substrate P-substrate
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CMOS FABRICATION PROCESS well formation
Phosphorus ion Ion bombardment by ion implantation SiO2 as mask, uncovered area will exposed to dophant ion
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CMOS FABRICATION PROCESS isolation formation
Thick oxide Increase SiO2 thickness by oxidation at high temperature Oxide will electrically isolates nmos and pmos devices
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CMOS FABRICATION PROCESS transistor making
pmos will be formed here nmos will be formed here LOCOS (isolation structure) By photolithography and etching process, pmos and nmos areas are defined
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CMOS FABRICATION PROCESS transistor making
Gate oxide Grow very thin gate oxide at elevated temperature in very short time
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CMOS FABRICATION PROCESS transistor making
polisilicon Deposit polisilicon layer
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CMOS FABRICATION PROCESS transistor making
gate Photolithography (photo) and etching to form gate pattern
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CMOS FABRICATION PROCESS transistor making
Arsenic ion photoresist Photo process to define the nmos’s active (source and drain) area and VDD contact Ion implantation with Arsenic ion for n+ dophant. Photoresist and polisilicon gate act as mask
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CMOS FABRICATION PROCESS transistor making
VDD contact source drain Nmos’s Source and drain with VDD contact formation Resist removal
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CMOS FABRICATION PROCESS transistor making
Boron ion photoresist Photo process to define the GND contact and pmos’s active area (source and drain) Ion implantation with boron ionto have p+ dophant Photoresist and gate act as mask
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CMOS FABRICATION PROCESS transistor making
GND contact Pmos’s drain Pmos’ source Pmos’s source and drain formation with GND contact Resist removal
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CMOS FABRICATION PROCESS interconnection
SiO2 Deposit SiO2 layer through out wafer surface
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CMOS FABRICATION PROCESS interconnection
contact Photo and etching process to make contact
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CMOS FABRICATION PROCESS interconnection
Metal 1 Metal 1 deposition throughout wafer surface
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CMOS FABRICATION PROCESS interconnection
Photo and etching processes to pattern interconnection
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Mask Layout
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Mask Layout
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Mask Layout
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Mask Layout
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A A’ oxide p-substrate n+ N-well p+ Metal 1
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Assignment B B’
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GLOSSARY Photolithography (photo) Etching Diffusion Ion implantation
Process of transferring pattern on mask to photoresist layer on wafer surface (pre-pattern the chip) Etching Process of permanently removed the unwanted part of design on wafer surface to get the desired pattern Diffusion Process of introducing dophant layer by movement of dophant atoms from high concentration to low concentration area at high temperature Ion implantation Process of introducing dophant layer by bombardment of high energy dophant ion in high electric field chamber Oxidation Process of growing thick or thin SiO2 layer depend on oxide application CMP Process to physically grind flat to have a planar surface for better exposure at photo process.
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THE END
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