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Realizing Integration of Metrology, Quality, and Instrument Development and Support with Information System Yeou-Song (Brian) Lee Anritsu Company Aug.

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Presentation on theme: "Realizing Integration of Metrology, Quality, and Instrument Development and Support with Information System Yeou-Song (Brian) Lee Anritsu Company Aug."— Presentation transcript:

1 Realizing Integration of Metrology, Quality, and Instrument Development and Support with Information System Yeou-Song (Brian) Lee Anritsu Company Aug. 20, 2003

2 Outlines Instrument Life Cycle Support In-Action: Metrology for Quality Lesson Learned Conclusions

3 Needs in the Product Life Cycle Design and Development- Spec Pilot and Production- Process Capability Service and Support- Calibration Software (Productivity and Customer Satisfaction)

4 Three Business Fundamentals Quality Cost Delivery Key success factor: Information technology

5 Contributions to the Business Success Metrology-Basis for measurement Quality-Efficiency and Effectiveness Reliability-Return on investment

6 Example- Power sensor A device that measures microwave power. A device that measures microwave power. Parameter- Calibration Factor Parameter- Calibration Factor Conventional Product Development Process Conventional Product Development Process Nagging Issues across Functional Boundary Nagging Issues across Functional Boundary

7 Must Spec. Dev. Design Pilot Manu. Service Customer Support Conventional Approach Problems: Time Consuming and Operational Ineffective

8 Must Spec. Dev. Design Pilot Manu. Service Customer Support Speedy Approach Metrology

9 Engineering Calibration Support Process Test procedures, traceability, type B measurement uncertainty Complete uncertainty analysis, statistical process control, Process Capability (CPK)

10 Metrology Requirements Travel standards traceable to national standards. (2.92 mm connector Power sensor) Transfer system required to relate the travel standards to primary standards and working standards: repeatable, reproducible, and reliable Comparison standards: inter-laboratory comparison Uncertainty analysis: Type A and Type B Measurement techniques for device characterization: repeatable, reproducible, and reliable

11 Comparison

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13 Measurement Uncertainty Examples

14 Calfactor Uncertainty - Excel

15 Gage R&R

16

17 Process Capability CpK- Must Spec Limits (Design Center) divided by 6 σ Process Index- Design, Manufacturing, and Testing

18 Quality and Reliability Control Limits Information System

19 Key Challenges Define the process: test, manufacturing, communication Data process: multi-frequency and multi- points computation

20 SPC Test Program Bad calfactor point. Re-run calfactor. Process Changed. Needed new SPC limits.

21 Top five issues identified for process improvement

22 Field reliability improvement from 4-sigma towards 5-sigma level

23 Lesson Learned Information system enhances the team approach problem-solving. Some times we observe almost in-situ or near real time problem diagnosis and solving. Relate the problems to the person who has the knowledge to solve the problems. Manufacturing owns the first line of investigation, level of responsibility and accountability. Rely on data, measurement and intelligence to make decisions. Metrology brings in confidence.

24 Value-Added Tasks Conduct uncertainty analysis of measurements Assist interpretation of the measurement results and related process Become Process facilitators and identify process owner Engage yourself with customers from both ends: specification (defining a product or service) to customer advocacy (service and support of customer feedback)

25 Conclusions Roles of Metrologist- Walls Beyond Cal/Std Lab Adopt New Tools and Process Quality-Core Contribution

26 Excellence is never an accident. It is always the result of high intention, determined effort and skilled execution.

27 References Bhote, Keki R. and Bhote, Adi K. “World Class Quality: Using Design of Experiment to Make It Happen”, American Management Association, 2nd ed. 2000 EA 4-02: Expression of the Uncertainty of Measurement in Calibration, Dec. 1999


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