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1 ATML Status January 2008 Issue 14 An overview of the ATML activity in the ATML focus group and as part of the IEEE SCC20 sub-committees.

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Presentation on theme: "1 ATML Status January 2008 Issue 14 An overview of the ATML activity in the ATML focus group and as part of the IEEE SCC20 sub-committees."— Presentation transcript:

1 1 ATML Status January 2008 Issue 14 An overview of the ATML activity in the ATML focus group and as part of the IEEE SCC20 sub-committees

2 2 ATML ATML’s mission is to define a collection of XML-based schemas that allows ATE and test information to be exchanged in a common format adhering to the XML standard ATML defines a framework through which different architectures using XML can be implemented. –defines the components from which users can build their architectures, whilst being interoperable with other compliant architectures. –Show examples of the net centric services by which this information can be exchanged across different ATS platforms as part of a maintenance process. –defines the XML format that these elements. The ATML specifications will define: –How to define XML schemas that represent ATE and test information. –A set of XML schemas supporting the exchange of specific ATE and test information. The ATML specifications will support: –services that can be used for exchanging ATE and test information in a distributed net-centric environment. –services supporting the exchange of specific ATE and test information in specific common areas.

3 3 ATML

4 4 SCC20 & ATML Organisations The IEEE SCC20 is the standards organisation through which the ATML components (i.e.; schemas and documentation) will be published under various IEEE standards. The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML. –The ATML group provides draft schemas and associated documents, examples, use cases, requirements and conducts trial use of any ATML components. –Their findings are submitted to the various SCC20 sub- committees and working groups to advance the IEEE standards associated with the ATML components.

5 5 SCC20 Organisation for 2008

6 6 ATML’s 2008 Objectives & Goals To have the P1671.2 (Instrument Description) Trial-Use Standard: –complete the formal ballot process by May 2008 –to submit as a trial-use standard by Q3 2008 To have the P1671.5 (Test Adapter) Trial-Use Standard: –complete the formal ballot process by Jul 2008 –to submit as a trial-use standard by Q3 2008 To have the P1671.6 (Test Station) Trial-Use Standard: –complete the formal ballot process by Jul 2008 –to submit as a trial-use standard by Q3 2008 To have the P1671.1 (Test Description) Trial-Use Standard: –written, reviewed and to start the formal ballot process by May 2008 –Ready for publication Dec 2008 –to submit as a trial-use standard by Q5 2008

7 7 ATML’s 2008 Objectives & Goals (cont) Review associated candidate schemas for all ATML components –Q1 Signal Description (STD - 1641) Errata v2 –Q2 RAI Annex as an Interpretation –Q3 Update 1671-2006 & errata for draft full use standard –Q4 Signal Description (STD - 1641) 2009 new Draft Standard Review All IEEE Std 1671 ATML Components (P1671.1 thru P1671.6 & P1636.1) in line with 1671 draft Full Use Standard

8 8 Standards & Schema Revisions (1 of 2)

9 9 Standards & Schema Revisions (2 of 2)

10 10 ATML Overview & Architecture (IEEE Std 1671-2006) IEEE Std 1671-2006 –Published December 16, 2006 –Common schema Version 1.01 –HardwareCommon Version 1.01 Errata Document to “replace” published Annex B –Presently at Draft 10 –Errata until 2009; to be posted on IEEE Errata web-site Common schema Version 2.01 HardwareCommon schema Version 2.02 TestEquipment schema Version 0.16 –Published IEEE Std 1671™-2006 did not include Test Equipment

11 11 ATML Overview & Architecture (cont) ATML Capabilities –Proposed as “new” Annex C Errata to IEEE Std 1671 until 2009; to be posted on IEEE Errata web-site –Annex Document presently at Draft 1.1 –Capabilities schema Version 0.04 ATML Pins, Ports, Connectors –Material to be posted on the IEEE Interpretations web-site & TII web-site Future ATML Users Guide

12 12 ATML Test Description (P1671.1) TaskDate (month/day/year) Draft StandardDraft 0.4 available for review Upload Draft Document to IEEE MEC MEC Approval Invitation to Ballot Initiate Ballot Ballot Closed Initial Ballot Results -

13 13 ATML Instrument Description (P1671.2) TaskDate (month/day/year) Draft StandardDraft 6: 09/04/07 Incorporates Synthetic Instruments as Annexes: Up-converter, Down-Converter, ARB, Digitizer Upload Draft Document to IEEE MEC 09/04/07 MEC Approval10/12/07 Invitation to Ballot10/22/07 (Closed 11/15/07) Initiate BallotDraft 8: 11/28/07 Ballot Closed01/14/08 Initial Ballot Results –Passed Number of Balloters = 45 44 Responded 97.8% (≥ 75% of balloters) Affirmative = 36 Negative = 4 Abstain = 4 Approval Rate 90.0% (≥ 75% of returned ballots) Abstain Rate 9.1% Number of Comments = 553 (572)

14 14 ATML Instrument Description (cont) TaskDate (month/day/year) Ballot Resolution01/15/08-TBD Re-Circulation Ballot Re-Circulation Ballot Closes Recirculation Ballot Results IEEE RevCom Submittal Package IEEE RevCom Meeting

15 15 ATML UUT Description (IEEE Std 1671.3-2008) TaskDate (month/day/year) Draft StandardDraft 3: 03/03/07 Upload Draft Document to IEEE MEC 03/03/07 MEC Approval04/04/07 Invitation to Ballot04/25/07 Initiate BallotDraft 6: 06/13/07 Ballot Closed07/13/07 Initial Ballot Results - Passed Number of Balloters = 55 45 Responded 81.8% (≥ 75% of balloters) Affirmative = 40 Negative = 2 Abstain =3 Approval Rate 95.2% (≥ 75% of returned ballots) Abstain Rate 6.7% Number of Comments = 118

16 16 ATML UUT Description (cont) TaskDate (month/day/year) Ballot Resolution07/13/07-09/05/07 All 118 comments have been addressed Regardless of classification or vote Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified. Re-Circulation BallotDraft 8: 09/05/07 Re-Circulation Ballot Closed 09/14/07 Recirculation Ballot Results - Passed Number of Balloters = 55 48 Responded 87.3% (≥ 75% of balloters) Affirmative = 44 Negative = 2 Abstain =2 (1 Lack of time, 1 Other) Approval Rate 95.7% (≥ 75% of returned ballots) Abstain Rate 4.2% Number of Additional Comments = 22 IEEE RevCom Submittal Package 10/09/07 IEEE RevCom Meeting - Approved 12/05/07 preliminary RevCom comments received/addressed November 2007

17 17 ATML UUT Description (cont) TaskDate (month/day/year) Copy-Edited Review package due 01/30/08 Comments & Corrections due 02/20/08 Target IEEE Publication date 03/31/08

18 18 ATML Test Configuration IEEE Std 1671.4-2008 TaskDate (month/day/year) Draft StandardDraft 3: 03/03/07 Upload Draft Document to IEEE MEC 03/03/07 MEC Approval04/04/07 Invitation to Ballot04/25/07 Initiate BallotDraft 6: 06/13/07 Ballot Closed07/13/07 Initial Ballot Results - Passed Number of Balloters = 54 44 Responded 81.5% (≥ 75% of balloters) Affirmative = 39 Negative = 2 Abstain =3 Approval Rate 95.1% (≥ 75% of returned ballots) Abstain Rate 6.8% Number of Comments = 102

19 19 ATML Test Configuration (cont) TaskDate (month/day/year) Ballot Resolution07/13/07-09/05/07 All 102 comments have been addressed Regardless of classification or vote Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified. Re-Circulation BallotDraft 9: 09/05/07 Re-Circulation Ballot Closed 09/14/07 Recirculation Ballot Results - Passed Number of Balloters = 54 47 Responded 87.0% (≥ 75% of balloters) Affirmative = 44 Negative = 1 Abstain =2 (1 Lack of time, 1 Other) Approval Rate 97.8% (≥ 75% of returned ballots) Abstain Rate 4.3% Number of Additional Comments = 1 IEEE RevCom Submittal Package 10/02/07 IEEE RevCom Meeting - Approved 12/05/07 preliminary RevCom comments received/addressed November 2007

20 20 ATML Test Configuration (cont) TaskDate (month/day/year) Copy-Edited Review package due 03/05/08 Comments & Corrections due 03/26/08 Target IEEE Publication date 04/30/08

21 21 ATML Test Adapter (P1671.5) TaskDate (month/day/year) Draft StandardDraft 4: 10/01/07 Upload Draft Document to IEEE MEC 10/01/07 MEC Approval10/12/07 Invitation to Ballot11/28/07 (Closed 12/28/07) Initiate BallotImmediately after the Orlando meeting Ballot Closes Initial Ballot Results -Number of Balloters = 32

22 22 ATML Test Station (P1671.6) TaskDate (month/day/year) Draft StandardDraft 4: 10/01/07 Upload Draft Document to IEEE MEC 10/01/07 MEC Approval10/22/07 Invitation to Ballot11/28/07 (Closed 12/28/07) Initiate BallotImmediately after the Orlando meeting Ballot Closes Initial Ballot Results -Number of Balloters = 32

23 23 ATML & SIMICA / AI-ESTATE (IEEE-1636.1, P1636.2 & IEEE-1232) SIMICA:Test Results and Session Information –IEEE Std 1636.1-2007 –TestResults schema Version 2.03 –TestResults EXPRESS model SIMICA:Maintenance Action Information (MAI) –Draft standard under development –Draft MAI schema Version 0.11 –Draft MAI EXPRESS model under development AI-ESTATE: (Update to IEEE Std 1232-2002) –Draft updated standard under development –Draft XML schemas under development –Draft updated EXPRESS models under development

24 24 ATML & STD (IEEE-1641) STD: (Update to IEEE Std 1641-2004) –Draft updated standard under development –Draft updated schemas under development

25 25 Balloting - Spanning Calendar Years Clarification –Once the initial ballot begins, the ballot group is set until all rounds of balloting are finished. –Even if a ballotter does not renew his or her IEEE membership. myProject and myBallot accounts remain active only for activities selected while IEEE membership was active. myProject will indicate that IEEE membership has expired. All votes and comments are valid, and are to be handled as any other IEEE-SA member. –The IEEE does not wish to re-establish balloting constituencies.

26 26 IEEE Std1671-2006 Schema & Document Locations

27 27 2008 Meeting Schedule Face-to-Face Meetings: –Jan. 15-17; Orlando, FL (Lockheed Martin) –Apr. 1-4 or 7-11; SCC20 08-1 St. Louis, MO (Boeing) –Jun./Jul. TBD; Open - no meeting presently planned –Sept. TBD; SCC20 08-2 possibly Salt Lake City, UT In conjunction with AUTOTESTCON (Sept. 8-11) –Oct./Nov. TBD; Open - no meeting presently planned Additionally: –Bi-Weekly Teleconferences –4 Meetings a year plus additional break-out working groups as necessary –Synchronise with SCC20 meetings


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