1. Open Book, Open Note, Bring a Calculator
Exam 2 Topics
Open Book, Open Note, Bring a Calculator
3-4 Multipart Questions
Device Packaging, Mfg Production Design
Substrates: PCB’s, Flex Circuits, Materials, Basic Mfg Process
Thru Hole Packages: Discretes, ICs
SMT Packages: Discrete, Small Outline, Flatpack, Chipcarrier, Array
Sockets, Interconnection Systems
TH Mfg Processes: Prep, Insert, Wave Solder, Trim, Test
SMT Mfg Processes: Prep, Screen Solder Paste, Place, Reflow, Test
Microelectronic Assembly: Chipscale, MCM, COB, Wirebond
Testing & Inspections: ICT, FCT, JTAG, Visual, AOI, XAOI, Stresses
Manual vs Automatic Assembly Operations
Levels of Assembly/Test
IPC Assembly Class 1, 2 and 3 Workmanship Levels

2. Analog Design For Mass Production
Op Amp Basic Inverting, Non-inverting configurations, Nom Gains
Op Amp Vio, Iio, Ib, Ad, Ac, CMRR, Slew Rate
DC Errors caused by Vio, Iio, Ib
Gain Errors caused by Ad
Total Error Voltage and Effects of Resistor Tolerance
Slew Rate Distortion
Op Amp max Vout, Iout
Basic frequency response circuit analysis
Finding Av(s) from circuit analysis
Steady State Response Av(jw)
Finding Mag |Av(jw)|, Phase |Av(jw)|, from Av(s)
Discrete Component Specification
Noise Sources
What types of Analysis are Required or Suggested for Subcircuits

3. Digital Design for Mass Production
Basic Technology Families for IC’s (TTL, CMOS, etc)
Basic DC drive data sheet parameters (Vih, Iol, etc)
DC drive design compatibility analysis
6 Life Cycle Phases and Statistical Relationship
Std and Schmitt Trigger Inputs
Totem pole, Open Collector (Drain) and Tristate Outputs
Edge Rates, Noise Margins, Comparators, Schmitt Triggers
Logic Level Voltage Translations
Basic Combinatorial Design, DeMorgan Gates
Truth Tables, Karnaugh Maps, Min Terms
Flipflop types, timing specifications (Tsu, Th, etc)
Metastability MTBF
Timing diagrams & Timing Analysis Using Target Device
State Diagrams, State Variables, Transitions, Inputs/Outputs
Simple State Machine Design, Moore and Meally Types
Programmable Devices, PLDs, ROMs
Equation Based State Machine Design

4. Mixed Signal Design For Mass Production
Basic Analog Digital Numeric Conversions
A/DD/A Maximum SNR
SAR, Integrating, Flash and Sigma-Delta Converter Architectures
Converter Errors
Quantization Error
Gain Error
Offset Error
INL
DNL

5. Statistics & Reliability
Basic Stats: Mean, Std Deviation, Median, Mode
Specification Limits, Z values
Samples vs Full Populations, Normal and Weibull Distributions
6 Sigma Quality, 1.5 sigma Shifts, Z values
Bathtub Curve, Failure Rate vs Time, Infantile vs End of Life Failures
6 Life Cycle Phases and Statistical Relationship
Physics of Failure, CTE mismatch, fatigue
Series Reliability vs Parallel/Redundant
MTBF, Reli(%) and FITs
Allocation & Reliability Summation, l, R(t), Warranty, , h
Stresses and Stress Factor Multipliers, P
Prediction Standards and Databases
Parts Count Prediction Method Flaws
Component Derating Guidelines, Capacitor Applications
HALT, HASS, HAST, ESS Processes and Stress Accelerations
Life Stress Modeling

6. Intellectual Property
4 Types of IP
Definition & Purpose of a US Patent
Patent Limitations and Coverages
Types of Patents
Criteria for Patentability
Prior Art
Format of Patent, Sections
Sustainability & Verification
Life Cycle Phases and Obsolescence
User Manual Basics
Forms of Objective Evidence
3 methods of verification