1. Qualification of components (Electronics)
AIDA WP8.4
Qualification of components (Electronics)
Mauro Citterio
on behalf of
INFN Milano
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

2. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
INDEX
Literature/Standard Survey …. Some results
Irradiation requirements
Peculiarity of High Energy Physics (HEP) environment
Test case presented: Electronics for the ATLAS Calorimeter
Test plan …. In the following months
Some on-going measurements
In collaboration with LHC experiments
In collaboration with other INFN programs
Power MOSFETs under irradiation
exposed to ionizing radiation (gamma 60Co)
exposed to heavy ions (75Br at 155 MeV) and protons (216 MeV)
Conclusions
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

3. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
Literature/Standard Survey
Existing data on “rad-tolerant” electronics components from LHC show a “non–uniform” set of results
Very different “environment” where components needs to operate
Literature dominated by “non-HEP” Standard
Sources: IEEE NSREC Data Workshop and Proceedings, RADECS Data Workshop and Proceedings, ESA Contract Reports, ESA Radiation Design Handbook. PSS 609, IEEE Publications
Total Ionizing Dose Standards: SCC (ESA SCC), Mil Std 883E Method (DESC), ASTM F1892 (includes ELDRS)
Single Event Standards: SCC (ESA SCC), EIA/JEDEC Standard EIA/JESD57, ASTM F1192
However some guidelines can be extracted, at least to compare with similar studies already made
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

4. Useful inputs from survey
Dose-rates for testing.
- High Dose Rate:
SCC Window rads/sec.
MIL883E rads/sec.
- Low Dose Rate:
SCC Window rads/sec.
MIL883E rads/sec.
Elevated Temp rads/sec.
Typical condition
Test conditions
Not Common in our field,
Should be considered …. It could be the “real worst case”
Sample Size/Traceability
Sample Size:
Total Ionizing Dose. Minimum 5 samples. 4 test, 1 reference.
Single Event. 3 samples recommended.
Traceability
Use single Lot Date Code for test to avoid “Safety Factors”
It is easy to do, but it is rarely done
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

5. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
Test conditions
Limited Comparison
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

6. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
Component database: must contain “proper” information on the testing procedure
Predict radiation spectra/doses for the experimental “region” where tested components will operate, before doing the test.
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

7. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
Case Study:
ATLAS Liquid Argon Electronics:
The major background is due to neutrons and gammas.
On the right is a simulated spectrum of particles.
How the space environment looks like (at least for neutron)?
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

8. Case Study for neutron:
Courtesy of Helio Takai (BNL)
Space environment
is similar at least for the neutron spectra up to 100 MeV (after a scale factor ).
We need to find irradiation facilities with similar spectra.
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

9. Case Study for neutron:
IEEE paper, Author: Charles Slayman
Some facilities exist and data are available from literature
They are the best choice to irradiate components
AIDA facilities should be “included” in a similar plot
This test case should be repeated for various environment !!! … on going activity
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

10. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
Case Study for proton:
Courtesy of Helio Takai (BNL)
Moreover the energy of the beam has an effect on the degradation
We need not only to have a metric to compare against but we need also to “evaluate” rad tolerance of new technology
More “HEP typical” test cases are under study
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

11. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
Test Plan
The research program will be focused on the characterization against radiation (ionizing and not) of electronics components and circuits
commonly used in high energy physics experiments.
Some class of devices to be tested are
ADCs, MUX, Clock generator, PLLs,
Field Programmable Gate Arrays (FPGA),
Power Mosfets, GaN Mosfets
DC-DC converter and Point of Loads (POLs)
The devices to be tested will be both commercial and custom made devices.
The latest are mostly component developed by CERN or CERN's collaborator in various technologies, such as silicon CMOS (130 and 65 nm), Silicon Germanium (SiGe 250 and 130 nm) and Silicon on Saffire (250 and 180 nm).
Beam line
Device under test
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

12. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
Test Plan
Displacement damage tests will be performed with both proton an neutron beams:
TSL facilities (Uppsala) PAULA and ANITA are the current baseline
UCL at Louvain-la-Neuve, LIF beam line is under consideration
Test will be performed on packaged and bare die devices (if available)
Max beam energy at extraction is relevant for commercial devices
INFN Milano will be willing to share beam time with other member of the collaboration for testing other type of devices.
List of the parameter to be tested is very long and need to be shortened, optimized and documented
Digital and analogue electronics have different set of parameters to be monitored
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Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

13. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
On going measurements
Courtesy of Huchen Cheng (BNL)
INFN Milano is participating to test on going in the ATLAS collaboration
Various ADCs are tested for TID and DD.
The data will be inserted in the AIDA Database
Still very difficult to get a “standard” report of the tests.
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

14. On going measurements
Power Mosfets exposed to gamma rays (INFN APOLLO experiment)
Devices under test:
30V STP80NF03L-04
30V LR7843
200V IRF630
For each type of device 20 samples were tested, 5 for each dose value
(tested at the ENEA Calliope Test Facility)
Used doses:
I Gray
II Gray
III Gray
IV Gray
Measurements :
Breakdown VGS=-10V
Threshold VDS=5V
ON VGS=10V
Gate VDS=10V
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

15. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
On going measurements
200 V Mosfet: IRF630 (courtesy of APOLLO Experiment)
Large parameters variation from device to device.
 How to document these results in a database?
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

16. Power mosfet exposed to protons
The results are still preliminary. Only the 200V Mosfets (IRF 630, samples from two different manufacturers) were exposed. Test done by measuring SEBs.
Proton energy: 216 MeV (facility at Massachusetts General Hospital, Boston)
Ionizing Dose: < 30 Krads
An “absolute” cross section will require the knowldege of the area of the Mosfet die which is unknown.
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Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

17. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
Power Mosfets …
The number of SEB events recorded at each VDS was small
 less then 30 events for the ST
 less than 150 events for the IR devices
 Large statistical errors affect the measurements
The cross section at VDS = 150 V (“de-rated” operating voltage) can not be properly estimated
Dependence from manufacturer
“Knee” not well defined
To effectively qualify the devices for 10 years of operation at Hi-LHC, the cross section has to be of the order of 10-17/ cm2, which puts the failure rate at <1 for 10 years of operation
Proton irradiation campaigns with increased fluences and more samples are planned.
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4

18. Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4
Conclusion
The survey of the existing data has given some input for the information that have to be gathered for the DATABASE
The irradiation facilities need to be chosen accordingly to the radiation spectra expected in the HEP experiments
Test on “typical” devices of interest in future HEP experiments (both in collaboration with other Institution and directly by INFN) are ongoing.
More and more results will be available in the coming months
The database will in any case a limited number of components
It is reasonable to imagine that the database will grow even after AIDA lifetime.
4/10/2013
Mauro Citterio - AIDA 2nd Annual Meeting: WP8.4