1. Setup for automated measurements (parametrization) of ASD2 chip
Hardware environment
ASD test board
Programmer board
Measurement instruments
Control software for PC
Post-processing of measurement data
Future improvements of test setup
Chip tester prototype
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

2. Hardware environment Programmable power supply Timer / counter
Programmable signal generator
ASD2 test-board
USB -> ASD serial interface board PC
Timer / counter
Oscilloscope
Multimeter
* PC connection options: USB, GPIB, Ethernet
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

3. PC USB to ASD serial interface adapter board
3.3V voltage regulator
FTDI FT2232H module with Miro-USB connector to PC host
ASD test board connector
Optocoupled interface
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

4. Test board with ASD2v5 mounted and wire bonded directly to PCB
3.3V voltage regulator
Connector for ASD serial interface
Standard MDT 16-pin input connector (bottom side)
Standard MDT mezzanine input protection network
SMA connectors for CH7`s input and analog output
Connector for digital outputs (LVDS)
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

5. Control software
Written in C# for Windows platform. Can also run on Linux via Wine emulator
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

6. Basic measurement types
Threshold scan
With ASD input floating (noise scan) – channel threshold offset, noise
With input signal applied – gain, gain uniformity among channels, linearity, signal path total noise
Measurement of channel digital output pulse width (ADC mode) vs:
Input charge
ASD programmable parameters: rundown current, integration gate etc..
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

7. Threshold scan with floating input
Gaussian fit gives:
Channel internal offset
Channel noise RMS
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

8. Threshold scan with floating input
Channel offset on-chip spread – “quality grade” of the chip
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

9. Threshold scan with input signal applied
Input signal - 1kHz square wave applied to a capacitor. Q = ∆V*C
Threshold crossing point - gain
S-curve`s slope – proportional to noise RMS
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

10. Threshold scan with input signal applied
Ch-to-ch gain uniformity
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

11. Threshold scan for different input charges
Linearity
Maximum charge, which can be suppressed by threshold
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

12. Composite measurement results
2 chips (16 channels) threshold scans combined
Ch-to-ch variation of gain is very low. At 10fC input charge signal amplitude variation is 9mV maximum (<4%)
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

13. Measurement with oscilloscope
Oscilloscope provides wide range of “mathematics” which simplify measurements, i.e. statistics (average, mean, sigma, etc.)
Setup for automated testing/measurement of ASD2 performance. S. Abovyan

14. Future improvements Input and output multiplexing
Prototype of final mass production chip tester
Setup for automated testing/measurement of ASD2 performance. S. Abovyan