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Objective of the Meeting

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Presentation on theme: "Objective of the Meeting"— Presentation transcript:

1 Objective of the Meeting
Consolidating the necessary platform to perform experiments of common Japanese-IRFU – MINOS, ACTAR, MUST2 … Mount an active exchange program between IRFU and Japanese institutions through RIKEN and with RIKEN in the domains of detection and electronic data collection. In view of:- Participating in developing a new high bandwidth, large dynamic range and channel number daq systems for the Nucl. Phys. community. Exchange of Students/Post Doc. In view of samuraï Building of shared expertise to enhance the use of highly segmented gas amplifiers at RIKEN .

2 Possible use of GET @ RIKEN
Emanuel Pollacco For GET Collaborations

3 A possible Plan Schedule of GET.
General comments about future experiments at RIKEN. A walk around MUTANT+BEM

4 Emanuel Pollacco IRFU/SPhN
For the GET collaboration

5 Objectives of the GET Project
Develop Front-End Electronics and Data Acquisition system for Active Targets tailered for the Nuclear Physics requirements. Low detection thresholds & High Luminosity Require: Internal versatile TPC Trigger High: dynamic range (~Z²), bandwidth, channel density Opportunity to develop a generic/reconfigurable approach for Nucl. Phys. to cover medium size systems. Emanuel Pollacco IRFU/SPhN

6 Systems to be covered by GET
Projects employing GET ACTAR ( GANIL, IRFU, IPNO, SFTC, …) – Micromegas + Si – 20k channels 2p-TPC (CENBG) – GEM/Micromegas – 20k channels AT-TPC (MSU, LBL …) – Micromegas – 12k channels GASPARD (GANIL, IRFU, IPNO, ... ) – Si & CsI – 15k channels BTD (IRFU & GANIL) – 100 channels Under Study S3 – (SPIRAL2) – Si channels SAMÜRAI-TPC (RIKEN) – Micromegas -15k channels MINOS  (p;2p, g) (IRFU) FISSION-TPC (IRFU) - Micromegas Emanuel Pollacco IRFU/SPhN

7 SYSTEM GET Conceptual Design (6 Hardware elements)
Possible derivatives – see Eric & Shebli µ-TCA AsAdASIC ADC FPGA PULSER T/V/I CoBo FPGA PAC Mutant Trigger FPGA ACTAR 1 Emanuel Pollacco IRFU/SPhN

8 Reconfigurable Approach
Via:- Hardware & Software Architecture (Documentation & Simulation tools Multi-lab Multi-project collaboration) µ-TCA AsAdASIC ADC FPGA PULSER T/V/I CoBo FPGA PAC Mutant Trigger FPGA Slow Control Software (Data Base Driven) Ext/Int Control Web Serv. Evolutive Data Formats Software Development /Debbuging Tools NARVAL for data managment Emanuel Pollacco IRFU/SPhN

9 MUST2-ASIC Engy/Time or AGET Shape/Time GASISIPLEX AGASP … ?
ASIC-A&N MUST2-ASIC Engy/Time or AGET Shape/Time GASISIPLEX AGASP … ? FPGA Temp, V, I, Cont. Slow-Cont. Interf. Front -End ADC Cooling Power Back –End Collector Slow.Cont. FPGA. Fast Switch PC-Farm Fast Memory 30 PAC AsAdASIC ADC PULSER FPGA T/V/I µ-TCA CoBo Mutant Trigger 1 Trigger Time.Stamp FPGA. Fast Memory 3

10 µ-VME system MUST2 MUST 2 ~ 2000ch 8 Telescopes = 8X 100cm²
256 DSSD E & T E 20KeV / T 300ps FWHM 16 ch Si(Li) 16 ch CsI Pulser PA+Amp+ Disc +TAC+multiplex in Vac

11 MUST2 Vacuum Cooling Unit Power supply V M E Security AUTOMAT Current
Tension Temperature Pressure Vacuum Cooling Unit Power supply S L O T G M T U 2 M C E N T R U M M U V I M U V I V M E

12 MUSETT COFEE board (64 strips) IPNO ATHED ASIC (16 strips E + T,
36 mm2, slow controlled) DSSD 10x10 cm2 strips 300 μm Windowless Resolution ~ 30 keV Detector module (with front-end electronics, cooling) Christophe THEISEN - EURORIB 2010

13 GET Shedule Conceptual Design R&D Testing Procedures Production
HARDWARE (32,000 channels) SOFTWARE Testing Procedures Production

14 GET Schedule Conceptual Design R&D Testing Procedures
ASIC-A&N Conceptual Design R&D HARDWARE (32,000 channels) Front-end card – PCB – AsAd - 120 Analogical-Numeric ASIC - 480 Numeric – ASIC: FPGA - FIRMWARE ADC Back-end card – PCB – CoBo - 30 Numeric – ASIC: FPGA – FIRMWARE Fast Memory Back-end card – PCB – Mutant - 3 Numeric – ASIC: FPGA-1 – FIRMWARE Numeric – ASIC: FPGA-2 – FIRMWARE µ-TCA - 3 Switch PC-Farm - 6 SOFTWARE Data acquisition management (NARVAL) Slow Control Testing Procedures Production (~max) 3000 AGET, 300AsAd, 80CoBo, FPGA Temp, V, I, Cont. Slow-Cont. Interf. AsAd ADC Cooling CoBo AsAd Power MuTant FPGA. Fast Memory CoBo FPGA. MuTant FPGA.

15 Schedule for GET

16 What would make us reach-out from the VME universe to the µ2 universe?
Number of channels Bandwidth Uniformity in the system building Need to launch-off from the VME based instrumentation Student support!

17 Beam Tracking VME Time-Stamp MINOS µ2 Time-Stamp µ2 Time-Stamp DALI2/ SHOGUN VME Time-Stamp Neutron-Wall VME Time-Stamp SHARAQ µ-VME Time-Stamp

18 Beam Tracking VME Time-Stamp ACTAR µ2 Time-Stamp MUST2 µ-VXI Time-Stamp SHARAQ µ-VME Time-Stamp

19 Beam Tracking VME Time-Stamp 2p-TPC µ2 Time-Stamp

20 Beam Tracking VME Time-Stamp µ2 Time-Stamp SAMURAÏ TPC µ2 Time-Stamp Si-Wall VME Time-Stamp Event Building CPU-Farm Storage Neutron-Wall VME Time-Stamp

21 MuTanT 3 Levels of Trigger: -LØ= External Trigger
-L1 = Multiplicity Trigger -L2 = Hit Pattern Trigger Gilles W (GET L2 TRIGGER – PHYSICS SCENARIOS GANIL-DEC09)

22 Continuity check Level 2 = Hit Pattern Trigger
Figure 3. Example of an ensemble of contiguous pads defining a track. Figure 3. Example of an ensemble of contiguous pads defining a track. Figure 3. Example of an ensemble of contiguous pads defining a track. Figure 3. Example of an ensemble of contiguous pads defining a track. Figure 3. Example of an ensemble of contiguous pads defining a track. Figure 3. Example of an ensemble of contiguous pads defining a track. Figure 3. Example of an ensemble of contiguous pads defining a track. Level 2 = Hit Pattern Trigger Continuity check Example of an ensemble of contiguous pads defining a track A track may be defined by a minimum number of continuous blocks Block size is important: - smaller block size = more efficient selection ( higher throughput …) - but more processing = more dead time

23 Origin check Level 2 = Hit Pattern Trigger
No valid blocks (=1) to the beam projection, The event is classified as a pure beam event and is accepted Some valid blocks (=1) are present at different position along the beam projection, the event is rejected

24 Level 2 = Hit Pattern Trigger
Isolated group of macropads have to be checked to know if it’s a fragment of a track The two possible lines do not cross valid blocks Event rejected A straight line could be defined by the two extreme blocks (in red) taking into account their coordinates The lines cross valid blocks Event accepted

25 MUTANT A 3- Level Numerical Trigger Event TPC Multiplicity Hit Pattern
Y/N Event TPC Multiplicity Hit Pattern Event TPC Multiplicity - Level #1 Trigger Y/N Ext to GET Event TPC - Hit Pattern Level #2 Trigger Y/N Event TPC ADC Read Calculated Hit Patten Data In Farm Data In GET Zero Remove Time Stamping Formating Data In GET Level # 3 Event-Building Data Reduction

26 Coding of TRIGGER Model Based Testing
Level # 0 ~ 0 ns Level # 1 ~ 300 ns Level # 2 ~70µs 40ns/sample Max/Channel 40X512ns =20µs Max/AGET 40X512X64ns =1.3ms Coding of TRIGGER Model Based Testing

27 BEM Vadatech µ-TCA

28 Coupling 2 or more µ2 systems
Back –End Collector Slow.Cont. ASIC-N - FPGA. Fast Switch Fast Memory 5 Trigger Master Time.Stamp ASIC-N - FPGA. Fast Memory 1 PC-Farm Storage Trigger Time.Stamp ASIC-N - FPGA. Fast Memory 3 Back –End Collector Slow.Cont. ASIC-N - FPGA. Fast Switch Fast Memory 30 Coupling 2 or more µ2 systems

29 EMC, Connectors, Cables, Monitoring, Testing & Security
Cooling Study CEM Study µ-TCA AsAdASIC ADC FPGA PULSER T/V/I CoBo FPGA Mutant Trigger FPGA SAMÜRAI -TPC Power Supplies Power SPY-BOX Emanuel Pollacco IRFU/SPhN

30 MUST2 – ASIC MATE


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