Presentation is loading. Please wait.

Presentation is loading. Please wait.

Resistors: Sheet resistances are process and material dependent. Typical values: - Gate poly-Si: Rsh= W/□ - High resistivity poly:

Similar presentations


Presentation on theme: "Resistors: Sheet resistances are process and material dependent. Typical values: - Gate poly-Si: Rsh= W/□ - High resistivity poly:"— Presentation transcript:

1

2 Resistors: Sheet resistances are process and material dependent. Typical values: - Gate poly-Si: Rsh= W/□ - High resistivity poly: Rsh= kW/□ - Metal (Al) films: Rsh= mW/□ - Doped Si regions - S and D regions: Rsh= W/□ - Well regions: Rsh= kW/□

3 Absolute tolerances: ≈ 20% Relative tolerances: Smaller (depend on the dimensions and lay-out) Contant resistances: Depend on the technology and size. Typical (max) values for AMS 035, A= 0.4 μm × 0.4 μm - Metal - poly: 2 (10) W/contact - Metal - n type S/D: 30(100) W/contact - Metal - p type S/D: 60(150) W/contact (n parallelled contacts decreases the resistance n times, and increases the reliability !)

4 Capacitors: - Passive (fixed) capacitors - Varactors

5

6

7 (a) (b) C C C V V t C depletion t layer C n - type bulk inversion
accumulation C max t ox C i depletion t d layer C d n - type bulk C min V GS V T (a) (b)

8

9

10

11

12

13

14

15 Package related problems
A typical RF-IC chip

16 Cross-section of a typical RF-IC package

17

18 I/O PADS (From Davis Harris, CMOS VLSI Design, 2004)
Pad types VDD / GND Output Input Bidirectional Analog Analog pads pass analog voltages directly in or out of chip - No buffering - Protection circuits must not distort voltages

19 ESD Protection Static electricity builds up on human body
Shock delivered to a chip can puncture thin gates Must dissipate this energy in protection circuits before it reaches the gates The basic ESD protection circuit with a current limiting resistor and diode clamps

20 Typical large-area ESD protection diode structures
Typical large-area ESD protection diode structures. - High current carrying and power dissipation capability - As low as parasitic capacitance

21 ESD testing Human body model to simulate the ESD hazard when a person tuches to a device.


Download ppt "Resistors: Sheet resistances are process and material dependent. Typical values: - Gate poly-Si: Rsh= W/□ - High resistivity poly:"

Similar presentations


Ads by Google