1. Date of download: 10/16/2017
Copyright © ASME. All rights reserved.
From: Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model
J. Electron. Packag. 2015;137(3): doi: /
Figure Legend:
(a) A photograph of the mated micro-USB connector, (b) a computer-aided design (CAD) model of the USB plug connector where the plug terminal is enlarged to show design details, and (c) a CAD model of the USB receptacle connector where the receptacle terminal is enlarged to show design details

2. Date of download: 10/16/2017
Copyright © ASME. All rights reserved.
From: Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model
J. Electron. Packag. 2015;137(3): doi: /
Figure Legend:
Relationships between the averaged amplitude and the frequency level of the surface of (a) C5191_P, (b) C5191_R, and (c) C18400_R

3. Date of download: 10/16/2017
Copyright © ASME. All rights reserved.
From: Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model
J. Electron. Packag. 2015;137(3): doi: /
Figure Legend:
Schematic drawing of the experimental setup for the temperature measurement of the mated micro-USB connectors

4. Date of download: 10/16/2017
Copyright © ASME. All rights reserved.
From: Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model
J. Electron. Packag. 2015;137(3): doi: /
Figure Legend:
Relationships between the calculated ECR based on the MSRS model and contact node numbers in the analysis model

5. Date of download: 10/16/2017
Copyright © ASME. All rights reserved.
From: Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model
J. Electron. Packag. 2015;137(3): doi: /
Figure Legend:
(a) Temperature distributions over the mated connectors with C5191_P–C5191_R based on the MSRS model. (b) Detailed temperature variations of the mated terminals inside the plastic housing.

6. Date of download: 10/16/2017
Copyright © ASME. All rights reserved.
From: Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model
J. Electron. Packag. 2015;137(3): doi: /
Figure Legend:
(a) Temperature distributions over the mated connectors with C5191_P–C18400_R based on the MSRS model. (b) Detailed temperature variations of the mated terminals inside the plastic housing.

7. Date of download: 10/16/2017
Copyright © ASME. All rights reserved.
From: Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model
J. Electron. Packag. 2015;137(3): doi: /
Figure Legend:
Continuous temperature distribution of the part of the mated C5191_P–C18400_R (a) captured by using the infrared thermal camera and (b) based on the MSRS model

8. Date of download: 10/16/2017
Copyright © ASME. All rights reserved.
From: Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model
J. Electron. Packag. 2015;137(3): doi: /
Figure Legend:
Temperature distributions over the mated C5191_P–C5191_R based on the conventional approach

9. Date of download: 10/16/2017
Copyright © ASME. All rights reserved.
From: Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model
J. Electron. Packag. 2015;137(3): doi: /
Figure Legend:
Temperature distributions over the mated C5191_P–C18400_R based on the conventional approach