1. GTK_EOC_V1
A. Kluge

2. Activities Summary Stand-alone test/DAQ system built up
independent & FPGA based
very efficient & professional (Matt)
A. Kluge

3. Activities Summary Analog front-end tests performed preamplifier
discriminator
very good results
-> Analysis - Massimiliano
A. Kluge

4. GTK_EOC_V1 Power consumption Simulations confirm present situation
Consumption of 100 mA comes from DLL and TDC hit registers
compared to other stand-alone DLL comparable
room for improvement
A. Kluge

5. Layout
E. Albarran, P. Jarron, A. Kluge, J. Kaplon, M. Noy, S. Tiuraniemi

6. AllPower 1.4VEnd ClockInGaasx0.8
E. Albarran, P. Jarron, A. Kluge, J. Kaplon, M. Noy, S. Tiuraniemi

7. AllPower1.4VEnd ClockInGaasx0.8
E. Albarran, P. Jarron, A. Kluge, J. Kaplon, M. Noy, S. Tiuraniemi

8. All power clock CCD b x5
E. Albarran, P. Jarron, A. Kluge, J. Kaplon, M. Noy, S. Tiuraniemi

9. Allpowerclock CCDbx5+allpower1.4EndClockInGaasx0.8
E. Albarran, P. Jarron, A. Kluge, J. Kaplon, M. Noy, S. Tiuraniemi

10. Hardware test & simulations
Design optimisation will be guided by hardware test and
simulations
A. Kluge
March 17, 2009

11. TDC results comparable with stand-alone DLLs in the past
TDC qualification
125 ps bin size
< 0.2 LSB differential and integral non- linearity
comparable with stand-alone DLLs in the past
Simulation -> Elena
Measurements -> Matt
A. Kluge

12. Result summary Analog front-end noise 56 e- jitter 70 ps
time walk compensated compensated jitter 70 ps
TDC
time bin 125 ps
integral and differential non linearity: < 0.2 LSB
jitter
A. Kluge

13. Plans main tests still to be done
full chain tests concerning jitter and resolution
Simulation & Lab tests: improvement analysis
long list of qualification tests
Schematic & Layout improvements
Re-submission
dates May 10, Aug
Lab based laser tests with bonded assembly
A. Kluge

14. Summary Full list of qualification test still to be done
GTK_EOC_V1 demonstrator results are encouraging
analog noise & jitter, TDC linearity
even more considering the given man power situation
the rather short development time
Full list of qualification test still to be done
GTK_EOC_V2 submission
increases quality and understanding
A. Kluge

15. A. Kluge
March 17, 2009

16. A. Kluge
March 17, 2009

17. amplifier (MF)
block box with cooling (Francois)
FPGA RO card (MN)
Laser (MF)
Splitter
Attenuator (GA)
µ-scope access
alignment light source
µ-manipulator (PR)
mounting mechanics (MM, GN)
assembly
sensor card (MN)
heat exchanger (GN)
chiller (GN,MM,JK)
xy table (MF) LV
computer (MN, MF)
optical table (MM) HV
notes: our 1060 nm laser is uncooled (frequ shift) -> controlled climate
Cooling test -> controlled temp + humidity

18. What do we want to test and how ->
work out test protocol.
the prototype sensor assembly at a later stage the GTK assembly in terms of
time resolution
time walk compensation
noise immunity
pixel by pixel uniformity (front-end and bump bonding quality)
temperature qualification
What do we need for these tests
work out test system, laser, mechanics, electronics, software
Where do we get the material from, cost and delay ->
purchase if required
How can we build the test system ->
hardware and software
Where will we do the test? ->
organize a long term test lab
14-4, Morel lab
First bonded assemblies planned for end of Feb
-> time line for laser setup
A. Kluge

19. Material Splitter (AK) amplifier (MF) Laser (MF) exist already
Spec: amplitude programmable
Type: waiting for offer
Price
Laser (MF) exist already
Spec
Splitter (AK)
Spec: more spec need to be discussed
Type:
Price: ~ 200 sfr
block box with cooling (MM, GN)
Spec: MM, GN will work out needs and propose a solution
A. Kluge

20. Material Spec: MM, GN will work out needs and propose a solution
Attenuator (GA, AK)
Spec: need to wait whether amplifier is programmable
Type:
Price
alignment light source(MM AK)
Spec: research needs to be done
mounting mechanics (MM, GN)
Spec: MM, GN will work out needs and propose a solution
heat exchanger (GN)
Spec:GN will work out needs and propose a solution
A. Kluge

21. Material optical table (MM) chiller (GN,MM,JK)
Spec: Spec:GN, MM, JK will work out needs and propose a solution
Type:
Price
optical table (MM)
Spec: MM collets offers HV
Spec: LV
A. Kluge

22. Material Spec: MF asks for offers Spec: PR proposes device
computer (MN, MF)
Spec: needs to be bought
Type:
Price
xy table (MF)
Spec: MF asks for offers
µ-manipulator (PR)
Spec: PR proposes device
assembly
Spec:
A. Kluge

23. Material µ-scope mounting Spec: not yet discussed Type: Price
sensor card (MN)
Spec:
FPGA RO card (MN)
Spec: MN needs to evaluate wether we need a 2nd
A. Kluge

24. A. Kluge
March 17, 2009