1. Shear test with irradiated samples
NA62 - DIPTEM Genova – UCL

2. Silicon samples Silicon
glue
Silicon samples 10 x 10 mm with wafers 525 µm thick
Shear tests with four different adhesive types:
Adhesive tape
NITTO DENKO 30 µm thick
Adhesive tape
3M 9461P – 30 µm thick
Adhesive film
FastelFilm 30 µm thick
Liquid glue
Araldite 2020
Polyester film double coated by acrylic adhesive
Polyester = W/m K
Acrilyc = 0.2 W/m K
3M Adhesive 100 (Acrylic adhesive)
3M Adhesive 100 = W/m K
EVA (Ethylene - vinyl Acetate) adhesive film
EVA = 0.34 W/m K
Two components epoxy liquid glue
Epoxy = W/m K
Surface cleaning with acetone
1 Kg for 3 minutes
80 °C in the oven (weight and plate already hot)
Surface cleaning with acetone
Vacuum outgassing after mixing the component
Dispensing with a slice
Surface cleaning with acetone
1 Kg for 65 hours
Surface cleaning with acetone
1 Kg for 65 hours

3. Irradiation Irradiation levels: No irradiation 3 x 10 13 1 x 10 14
NITTO 3M
FASTEL FILM
ARALDITE
No irradiation
N001
N002
N003
N004
N005
M001
M002
M003
M004
M005
F001
F002
F003
F004
F005
A001
A002
A003
A004
A005
3 x 1013
N131
N132
N133
N134
N135
M131
M132
M133
M134
M135
F131
F132
F133
F134
F135
A131
A132
A133
A134
A135
1 x 1014
nominal
N141
N142
N143
N144
N145
M141
M142
M143
M144
M145
F141
F142
F143
F144
F145
A141
A142
A143
A144
A145
1 x 1015
N151
N152
N153
N154
N155
M151
M152
M153
M154
M155
F151
F152
F153
F154
F155
A151
A152
A153
A154
A155
Spare
NS6
NS7
NS8
NS9
NS0
MS6
MS7
MS8
MS9
MS0
FS6
FS7
FS8
FS9
FS0
AS6
AS7
AS8
AS9
AS0
Irradiation levels:
No irradiation
3 x 10 13
1 x 10 14
1 x 10 15
Araldite: 25 samples
FastelFilm: 25 samples
NittoDenko: 25 samples
3M: 25 samples
Green = glued in Genova the
Red = glued at CERN the

4. Machine
INSTRON 8802 –
Floor Model Fatigue Testing Systems up to 500 kN
Top clamp
Bottom clamp

5. Results NITTO 3M FASTEL FILM ARALDITE No irradiation N001 N002 N003
M005 (Si broken)
F001
F002 (open)
F003
F004
F005
A001 (Si broken)
A002 (Si broken)
A003 (Si broken)
A004 (Si broken)
A005 (Si broken)
3 x 1013
N131
N132
N133
N134
N135
M131
M132
M133
M134 (Si broken)
M135
F131
F132 (open)
F133
F134
F135
A131 (Si broken)
A132 (Si broken)
A133 (Si broken)
A134 (Si broken)
A135 (Si broken)
1 x 1014
nominal
N141
N142
N143
N144 (Si broken)
N145
M141
M142
M143
M144
M145
F141
F142 (open)
F143 (Si broken)
F144 (open)
F145
A141 (Si broken)
A142 (Si broken)
A143 (Si broken)
A144 (Si broken)
A145 (Si broken)
1 x 1015
N151
N152
N153
N154
N155 (open)
M151
M152
M153
M154
M155
F151 (displaced)
F152 (displaced)
F153 (displaced)
F154 (displaced)
F155 (displaced)
A151 (Si broken)
A152 (Si broken)
A153 (Si broken)
A154 (Si broken)
A155 (Si broken)
Spare
NS6
NS7
NS8
NS9
NS0
MS6
MS7
MS8
MS9
MS0
FS6
FS7
FS8 (open)
FS9
FS0 (open)
AS6 (Si broken)
AS7 (Si broken)
AS8 (Si broken)
AS9 (Si broken)
AS0 (Si broken)

6. NittoDenko – No irradiation
F force (N)= σ * 100
D displacement (mm)= ε * 10

7. NittoDenko - 3 10 13 - 1 10 14 - 1 10 15 F force (N)= σ * 100
D displacement (mm)= ε * 10

8. NittoDenko – Comparison

9. 3M – No irradiation
F force (N)= σ * 100
D displacement (mm)= ε * 10

10. 3M
F force (N)= σ * 100
D displacement (mm)= ε * 10

11. 3M – Comparison

12. Fastelfilm – No irradiation
F force (N)= σ * 100
D displacement (mm)= ε * 10

13. FastelFilm - 3 10 13 - 1 10 14 F force (N)= σ * 100
D displacement (mm)= ε * 10

14. FastelFilm –
F force (N)= σ * 100
D displacement (mm)= ε * 10

15. FastelFilm – Comparison

16. Araldite – No irradiation
F force (N)= σ * 100
D displacement (mm)= ε * 10

17. Araldite - 3 10 13 - 1 10 14 - 1 10 15 F force (N)= σ * 100
D displacement (mm)= ε * 10

18. Araldite – Comparison

19. Single Anodic bonding – Shear Test – Wafer CMI TEST 20483
Temperature: 350 °C
Silicon
Pyrex
Na2O Si
Voltage: 1000 V
Cleaning only with Plasma O2 X

20. Single Anodic bonding – Shear Test – Wafer CMI TEST 20483