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implementation of a 42 ps tdc based on fpga target
Speaker : Timothé Turko Contributors : * Mcf. Foudil Dadouche * Pr. Wilfried Uhring * Dr. Imane Malass * Jérémy Bartringer * Mcf. Jean-Pierre Le Normand 2016 ICube
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summary Context Time to Digital Converter Architecture
Methodology and realization Encountered problems and solutions Fast Time to Digital Converter characterization
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context “High-throughput time-correlated single photon counting in microfluidic droplets for enzymatic activity assays” Why Fluorescence Lifetime (FL) measurements instead of Fluorescence Intensity measurements? Due to the intrinsic character of FL studies, there are no interferences arising from volume differences, concentration, sample geometry or laser power, leading to high system sensitivity, accuracy and low noise level (Poisson noise).
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context Time to Digital Converter (TDC) specification :
FPGA target (Cyclone IV) Temporal resolution lower than 100 ps
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definition Time to Digital Converter Electronic instrumentation
Signal processing Time to Digital Converter Absolute time Digital (Binary) Output Events recognition providing a digital representation of the time
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Tm = TFine1 + TCoarse – TFine2
how does it works ? Two « Fine » counters One « Coarse » counter Tm = TFine1 + TCoarse – TFine2
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architecture Tapped Delay Line Ringed Oscillator
Maximum resolution : 10 ps Maximum resolution : 10 ps The resolution is imposed by the FPGA’s technological limits and not by the TDC’s architecture
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methodology and realization
One fine counter and associated control logic One coarse counter and associated control logic One Encoder to convert the TDC results on 8 bits A data communication tool : USB
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Logical simplification
first approach Logical simplification ! It is necessary to constrain the logical elements placement
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implemented solution New objectives:
Avoid the software data path simplification Increase TDC resolution by reducing the propagation time through delay elements Automate the elementary cells set-up process to optimize the design time and make possible the development of generic and adaptable structures This method is focused on two main areas: Using adders as delay elements and utilization of the Carry Chain Logic of the FPGA Using the Chip Planner tool
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carry chain Positionning failure of logical elements Achieve a minimum propagation delay Spacial constrain of logical elements positions is mandatory
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tdc characterization Using a delay generator: Start Stop
FPGA Delay Generator The measurement last a long time Allows to measure the jitter Stop Start signal Delay generator trigger Stop signal Start signal delayed
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tdc characterization Resolution : 42 ps Jitter : 90 ps RMS
INL : 132 ps RMS DNL : 50 ps RMS
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Replacement of the FPGA’s native DC/DC converter by a less noisy one.
tdc characterization Replacement of the FPGA’s native DC/DC converter by a less noisy one. Resolution : 42 ps Jitter : 26 ps RMS INL : 22 ps RMS DNL : 13 ps RMS
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results : fine tdc Resolution : 42 ps Jitter : 26 ps RMS
INL : 22 ps RMS DNL : 13 ps RMS Dead Time : 20 ns
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Light source + SPAD = Random events generator
tdc characterization Using Poisson process events: Light source + SPAD = Random events generator Statistically each TDC bins should go through the same number of event Photon SPAD STOP FPGA START Can not measure the Jitter Start and Stop signals are not dependent. The delay between both of them is totally random Very fast and accurate measurement
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tdc characterization
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tdc characterization Where : T is the total time range
M is the number of bins in the time range T
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transfer function correction
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case study Before correction After correction Visible static pattern
Lifetime : 4.21 ns ± 0.08 ns Static pattern clearly attenuated Lifetime : 4.19 ns ± 0.02 ns
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Conclusion Reached resolution : 42 ps Jitter lower than 1 LSB
Fast and accurate characterization Possibility to correct the transfer function
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