1. V80 Camera Test & Troubleshooting Training
Budi Juswardy
Singapore Design Centre - MIC Level 3
Personal Communication Sector, Motorola
DID:        (65)
Fax:         (65)
    
Budi Juswardy
April 2004

2. V80 Camera Test
Budi Juswardy
April 2004

3. V80 Camera Test for High Volume Mass Production
DLI TEST
Data Line Integrity Test (DLI)
To verify none of the parallel camera data bus lines are stuck high or low
To verify none of the parallel camera data bus lines are shorted together
Blemish, Noise Line Test
Blemish Test: Used to detect foreign material or defective pixels
Noise Line Test: Used to detect whether there is noise/ lines in the image produced by the camera sensor
Budi Juswardy
April 2004

4. Implemented by combinational logic circuitry in some imager modules
V80 Camera Test DLI Test
This built-in test pattern is generated by a “sum of coordinates” algorithm
Implemented by combinational logic circuitry in some imager modules
DLI Test Algorithm:
Monitor parallel camera data bus values from test image
Verify each data bit is low at some point
Verify each data bit is high at some point
Verify every possible data bit pair (D0:D1, D0:D2, etc.) is different (one high & one low) at some point
Verify every possible data bit pair (D0:D1, D0:D2, etc.) is not the same during the data analysis for not longer than 90% of the analyzed data. (% can be set)
Budi Juswardy
April 2004

5. Test will generate a file with the test result/ information
V80 Camera Test DLI Test
Test will generate a file with the test result/ information
The format:
Pass: 00; Fail: 01
Matrix: will compare one line to another line
High Line: will pull the line all to high, if pass will show FF, otherwise it will indicate where the line shorted to ground
Low Line: will pull the line all to low, if pass, will show FF, otherwise it will indicated where the line is shorted to Vcc
xx/xx/xx/xx
Low Line
High Line
Matrix
PASS/ FAIL
Budi Juswardy
April 2004

6. V80 Camera Test DLI Test
Test Algorithm Detail for 8-bit Bus Verify each of the following conditions pass for an overall pass (success) test result
D0 = low
D1 = low
D2 = low
D3 = low
D4 = low
D5 = low
D6 = low
D7 = low
xx/xx/xx/xx
D0 = high
D1 = high
D2 = high
D3 = high
D4 = high
D5 = high
D6 = high
D7 = high
Low Line
High Line
Matrix
(00)PASS (01)FAIL
D2 <> D3
D2 <> D4
D2 <> D5
D2 <> D6
D2 <> D7
D3 <> D4
D3 <> D5
D3 <> D6
D3 <> D7
D4 <> D5
D4 <> D6
D4 <> D7
D5 <> D6
D5 <> D7
D6 <> D7
D0 <> D1
D0 <> D2
D0 <> D3
D0 <> D4
D0 <> D5
D0 <> D6
D0 <> D7
D1 <> D2
D1 <> D3
D1 <> D4
D1 <> D5
D1 <> D6
D1 <> D7
Budi Juswardy
April 2004

7. E.g.: 00/FF/FF/FF: all pass 01/CF/FF/FF: matrix failed
V80 Camera Test DLI Test
E.g.:
00/FF/FF/FF: all pass
01/CF/FF/FF: matrix failed
CF = 1D71D60D50D4 1D31D21D11D0  D4=D5 (shorted)
01/FF/F8/FF: high line failed
F8 = 1D71D61D51D4 1D30D20D10D0  D2=D1=D0 (shorted to gnd)
01/FF/FF/3D: low line failed
3D = 0D70D61D51D4 1D31D20D11D0  D7=D6=D1 (shorted to Vcc)
Budi Juswardy
April 2004

8. V80 Camera Test Blemish & Noise Test
Blemish Test
Used to detect foreign material or defective pixels
Due to lens defect/ deformation, dust particle on lens or the sensor pixel damaged
(or could be due to the lens cover not removed).
Noise Line Test
Used to detect Horizontal Lines in the image
Horizontal Lines are caused by noisy analog supply line; OR
Camera sensor lens defect.
Budi Juswardy
April 2004

9. V80 Camera Test Blemish & Noise Test
Requirements for Blemish test:
NO blemishes of any size (0x0) is allowed in Region 1 (R1)
Not more than 1 of small blemish (1x2) or large blemish (2x3) is allowed in Region 2 (R2)
Fail if the blemish size is larger than (1x2) size
Requirement for Noise Line test:
No horizontal line noticeable or detectable in the camera viewfinder
Budi Juswardy
April 2004

10. V80 Camera Test Blemish & Noise Test
Budi Juswardy
April 2004

11. V80 Camera Test Blemish & Noise Test
Only one 1x1 in region 2: PASS
Lots of blemishes in region 1: FAILED
One large 5x3 in region 2: FAILED
Only one 3x1 in region 2: PASS
Budi Juswardy
April 2004

12. V80 Camera Test Blemish & Noise Test
Only one 1x1 in region 2: PASS
One large 3x3 in region 2: FAILED
Horizontal Lines
Budi Juswardy
April 2004

13. V80 Camera Test Blemish & Noise Test
Test Setup
Ambient fluorescent lighting sources
Test Chart at 18 to 25 cm distance
Fixture with open nest to locate and align the UUT
UUT (V80 Phone with camera facing test chart)
CE-Bus to PC 1 2 3 4 5
Side View Of the Test Fixture
Test Station PC
Test Flow
UUT powers up, enumerates, and is suspended.
Camera viewfinder opened (TST_CAMERA).
Test chart image captured (TST_CAMERA).
Test command (TST_CAMERA, parameter 0x06) initiates the Data Line Integrity test.
UUT returns Success or Failure response to Test Station PC.
Budi Juswardy
April 2004

14. Camera Test Chart Data Line Integrity Area (+10%) Blemish & Noise Test
Budi Juswardy
April 2004

15. V80 Camera Troubleshooting
Budi Juswardy
April 2004

16. V80 Camera Block Diagram Cover Lens Image Sensor VGA Radio board Flash
ATI 2250
Graphics
Accelerator
Baseband
Processor
Serial
VGA
LCD
Display
Control Lines
Data Lines
Image
Sensor
Lens
Cover
Flash
USB
Test Station PC
via CE Bus
JPEG Encode Only
C-Flex
Front Housing Blade
Radio board
PCB
Budi Juswardy
April 2004

17. What to check when camera test fail at this point.
Camera Test Sequence
What to check when camera test fail at this point.
ENTRY HD2 entry_handler_atlas_CIT_camera
GCI1STAT get_command_interface Check the CE Bus connector
SUS1STAT suspend_1 Reconnect the CE Bus connector
* backlight_light
CAM_EDLI DLI Make sure DLI pattern is only 10% on the viewfinder
Check and make sure camera alignment ok
DELAY104 Delay1_3_secs
CAM_SDLI DLI Check the generated error file (slide 5)
* camera_capture_VGA_DLI
ECMSTAT External_camera_image_transfer_status
CAM_BLS1 small_blemish_region_1 Check the Blemish image at region 1 (slide 9)
CAM_BLL1 large_blemish_region_1 Check the Blemish image at region 1 (slide 9)
CAM_BLS2 small_blemish_region_2 Check the Blemish image at region 2 (slide 9)
CAM_BLL2 large_blemish_region_2 Check the Blemish image at region 2 (slide 9)
CAMBLSTAT Blemish Test Status FAIL this section if any of CAM_BL* test fail
Remove the lens cover
No dust/ foreign particle or scratch at the lens
CAMNUMNL Camera_no_of_noise_lines Check the Noise Line image (NL) (slide 12)
CAMNLSTA NL_test_status FAIL this section if there is Noise Line detected
Not available Not available because log result was not called display in PC.
TOF_CMDI Turn_off Do not disconnect the USB cable from CE Bus until the test is completed
Budi Juswardy
April 2004

18. Fail DLI Test?
1. Open the backhousing, and check/ make sure the pin-to-pin connector of camera to the PCB Board is attached properly. RETEST.
2. Replace the camera sensor. RETEST.
Suspect it is either:
a. The B2B pin camera connector problems (see under microscope),
b. The camera flex problem or
c. The image sensor problem.
3. Replace the PCB Board. RETEST.
Suspect it is:
a. B2B of the PCB board to camera is shorted or open circuited
b. B2B of the PCB board to C-flex is shorted/ open.
If problem still exist after 3. :
4. Replace the blade. RETEST.
a. C-flex (B2B connector o/c)/ flex open/ shorted or
b. LCD issue (ATI) BGA crack, LCD B2B connector o/c/ LCD flex open/ shorted
Budi Juswardy
April 2004

19. Fail Blemish Test?
1. Check whether protective plastic for the cover lens has been removed.
2. Visually check whether the cover lens has foreign material on it.
3. Check whether the camera/ image sensor lens is clean/ clear from dust.
4. Open the backhousing, and check/ make sure the pin-to-pin connector of camera to the PCB Board is attached properly
5. Visually check the automated test result/ image generated by the camera
Any blemish on region 1?
Any blemish more than one (1) of the size 2x3 pixel or bigger on region 2?
Camera sensor/ image sensor lens defect
Save the image file with a unique file name for engineering analysis.
Budi Juswardy
April 2004