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Copyright © 2004 The McGraw-Hill Companies, Inc. All rights reserved.
Chapter 5 Static MOS Gate Circuits Copyright © 2004 The McGraw-Hill Companies, Inc. All rights reserved.
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5.2 CMOS Gate Circuits
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5.2 CMOS Gate Circuits
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5.2.1 Basic CMOS Gate Sizing
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5.2.1 Basic CMOS Gate Sizing
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5.2.1 Basic CMOS Gate Sizing
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(5.1) (5.2) 5.2.1 Basic CMOS Gate Sizing Equivalent width
series stack : parallel stack : (5.1) (5.2)
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5.2.2 Fanin and Fanout Considerations
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5.2.2 Fanin and Fanout Considerations
DeMorgan’s Laws (5.3)
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5.2.2 Fanin and Fanout Considerations
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5.2.2 Fanin and Fanout Considerations
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5.2.2 Fanin and Fanout Considerations
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5.2.3 Voltage Transfer Characteristics (VTC) of CMOS Gates
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4.6.1 DC Analysis of CMOS Inverter
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5.2.3 Voltage Transfer Characteristics (VTC) of CMOS Gates
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5.3 Complex cmos gates
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(5.4) (5.5) 5.3 Complex CMOS Gates Logic function
exchanging AND, OR operations apply DeMorgans (5.4) (5.5)
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5.3 Complex CMOS Gates
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5.3 Complex CMOS Gates
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5.4 xor and xnor Gates
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5.4 XOR and XNOR Gates
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5.5 Multiplexer Circuits
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5.5 Multiplexer Circuits
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5.6 Flip-Flops and latches
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5.6.1 Basic Bistable Circuit
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5.6.1 Basic Bistable Circuit
Average propagation delay (5.6)
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5.6.2 SR Latch SR Latch with NOR Gates
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5.6.2 SR Latch SR Latch with NAND Gates
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5.6.3 JK Flip-Flop
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5.6.4 JK Master-Slave Flip-Flop
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5.6.5 JK Edge-Triggered Flip-Flop
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5.7 D Flip-flops and latches
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5.7 D Flip-Flops and Latches
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5.7 D Flip-Flops and Latches
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5.7 D Flip-Flops and Latches
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5.7 D Flip-Flops and Latches
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5.7 D Flip-Flops and Latches
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5.7 D Flip-Flops and Latches
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5.7 D Flip-Flops and Latches
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5.8 Power dissipation in CMOS Gates
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5.8 Power Dissipation in CMOS Gates
General power equation : (5.7)
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5.8.1 Dynamic (Switching) Power
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(5.8) (5.9) (5.10) 5.8.1 Dynamic (Switching) Power
Average charging current : Power dissipation : (5.8) (5.9) (5.10)
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5.8.1 Dynamic (Switching) Power
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(5.11) 5.8.1 Dynamic (Switching) Power Time period :
Average crowbar current : Average power : (5.11)
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(5.12) (5.13) 5.8.1 Dynamic (Switching) Power Average power :
(using switching activity factor ) (5.12) (5.13)
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(2.32) (5.14) (5.15) (5.16) 5.8.2 Static (Stanby) Power (in Chapter 2)
(basic diode equation) Leakage current : Static power dissipation : (pseudo-NMOS, low output) (2.32) (5.14) (5.15) (5.16)
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(5.17) (5.18) 5.8.3 Complete Power Equation Power equation CMOS gate :
pseudo-NMOS gate : (5.17) (5.18)
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(5.17) (5.18) 5.8.3 Complete Power Equation Power equation CMOS gate :
pseudo-NMOS gate : (5.17) (5.18)
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5.9 Power and delay tradeoffs
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(5.19) (5.20) 5.9 Power and Delay Tradeoffs (average power)
(propagation delay) Power-delay product (PDP) Capacitor energy (5.19) (5.20)
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(5.21) (5.22) (5.23) 5.9 Power and Delay Tradeoffs
Energy-delay product (EDP) (propagation delay) using propagation delay (5.21) (5.22) (5.23)
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(2.25) 2.5.2 Current Equations for Velocity-Saturated Devices
Linear region operation (2.25)
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2.5.2 Current Equations for Velocity-Saturated Devices
Saturation region operation Limiting cases : ( ) ( ) (2.26) (2.27) (2.28) (2.29)
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5.9 Power and Delay Tradeoffs
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5.9 Power and Delay Tradeoffs
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5.9 Power and Delay Tradeoffs
Optimum EDP :
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5.10 Summary
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5.10 Summary Equivalent device width : Average propagation delay : Power : Complete power equation : (standard CMOS gate) (pseudo-NMOS gate) Energy-delay product :
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