1. 30-Nov-2006 Jean-Marc Defise - CSL jmdefise@ulg.ac.be
SWAP Calibration
30-Nov-2006
Jean-Marc Defise - CSL
SCSL Meeting – ISSI, Nov 2006

2. SCSL Meeting – ISSI, 29-30 Nov 2006
Calibration
Image quality
Overall throughput
Pixel-to-pixel non-uniformities (flatfield, vignetting)
Noise (electronic & straylight)
Instrument
design
Component
procurement
Mirrors
integration
Flight
unit
Theoretical response
Update instr. baseline
Compon. Characteriz°
Mirror WFE
Sensor throughput+FF
Filters
EUV l
Telescope quality
Real WFE
Vignetting (baffles)
VIS l
End-to-end tests
Throughput
Flatfield
Vignetting
Straylight
Noise
VIS l
EUV l
SCSL Meeting – ISSI, Nov 2006

3. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP
OPTICAL ELEMENTS
Mirrors + EUV coatings
figuring
reflectivity
EUV filters
throughput
light leaks
optical impact (grid)
Sensor + scintillator coating
flatfield
noise
“NON” OPTICAL ELEMENTS
Baffles
vignetting
Electronics
digitization
noise
compression
Thermal status
Image quality
SCSL Meeting – ISSI, Nov 2006

4. Component calibration
See previous SCSL meeting
SCSL Meeting – ISSI, Nov 2006

5. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP Filters
2 possibilities (Luxel):
Al filters (150 nm) + grid mesh (80 to 83 %)
optical impact, but high throughput
better mechanical resistance
Al filters (150 nm) + polyimid (70 nm)
lower EUV transmission
FOCAL FILTER
ENTRANCE FILTER
SCSL Meeting – ISSI, Nov 2006

6. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP Filters
Grid filters
SEM picture
SCSL Meeting – ISSI, Nov 2006

7. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP Filters
Grid filters – diffraction (entrance filter)
SCSL Meeting – ISSI, Nov 2006

8. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP Filters
Grid filters – shadowing (focal plane filter)
SCSL Meeting – ISSI, Nov 2006

9. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP Filters
Polyimid filters
(entrance filter)
SEM pictures
SCSL Meeting – ISSI, Nov 2006

10. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP: System Response
updated with filter selection
CMOS HAS +
Scintillator
Prox Eln
QS: ph/s/px
Update: QS: ph/s/px
AR: 2686 ph/s/px
Update:
AR: ph/s/px
QS: 6 DN/s/px
Update:
QS: DN/s/px
AR: 89 DN/s/px
AR: DN/s/px
- worst case assumption, EOL with 0°C
- new noise figures to be measured with real FM electronics
SCSL Meeting – ISSI, Nov 2006

11. SCSL Meeting – ISSI, 29-30 Nov 2006
Image Quality
Confirmed only by interferometric measurement at 633nm
No possibility for direct measurement in EUV (need EUV collimator, diffraction is dominating in VIS)
WFE maps at 633 nm can provide estimate for PSF at 17.4 nm – BUT without scattering
Scattering could be evaluated with PTB nearly-collimated beam (?)
SCSL Meeting – ISSI, Nov 2006

12. Calibration during TV @ CSL
Real thermal environment with all flight electronics (IIU, PE) but MCPM
Noise evaluation (dark images) at OP temperature
Cal. diodes reference images at OP temperature
2 diodes can illuminate
directly the CMOS
l = 570 nm
Will fly in SWAP FM unit
SCSL Meeting – ISSI, Nov 2006

13. End-to-end calibration
Planned at PTB in Jan’07 (week #3)
Spectral scan
FoV scan (throughput + possibly EUV flat field)
Out-of-FoV scan (offpointings)
SCSL Meeting – ISSI, Nov 2006

14. PTB Beam Characteristics
1010photons/sec at 17 nm. Can easily be adjusted for smaller intensities.
Shape of the beam: 1 x 1 mm²
can be decreased to 0.5 x 0.5 mm²
larger beam can be available, but homogeneity decreases
divergence ~6.8 arcmin (130 pixels spot diam in SWAP focal plane)
Spectral purity depends on the flux intensity, hence on the limiting slot, which will be adjusted before the instrument calibration, and before off-axis measurements
SCSL Meeting – ISSI, Nov 2006

15. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP PTB
SWAP FM unit
on a goniometer mount
+ translation stage
beam position will be adjusted
FoV scan
out-of-FoV scan
EUV Beam
SCSL Meeting – ISSI, Nov 2006

16. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP PTB
SWAP FM will be in the chamber with the IIU FM
A cooling system will be connected to the radiator mount, nominal -20°C but will be -40°C for out of FoV scans
FoV Scan => mosaic 3 x 3 or more if achievable. This should provide some data for flat field.
Out of FoV scan => straylight check for offpointings (need high detectivity, -40°C)
SCSL Meeting – ISSI, Nov 2006

17. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP PTB
Pupil FoV scan with the 1 mm² beam (vignetting verification)
Spectral scan from 16.5 to 20.0 nm
SCSL Meeting – ISSI, Nov 2006

18. SCSL Meeting – ISSI, 29-30 Nov 2006
SWAP PTB
Open point:
FM front filter during PTB calibration ?
risky (pressure sensitive, contamination sensitive)
in any case, focal filter will be present
any possibility to calibrate it separately ?
use a spare PTB ?
SCSL Meeting – ISSI, Nov 2006

19. SWAP in-orbit calibration
SWAP diodes (VIS only)
LYRA
Flatfield with offpointing manoeuvers ?
Intercalibration with other instruments ? EIT, SDO, STEREO ?
SCSL Meeting – ISSI, Nov 2006