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(Pressure measurement under harsh environments)

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Presentation on theme: "(Pressure measurement under harsh environments)"— Presentation transcript:

1 (Pressure measurement under harsh environments)
Micromachined pressure sensor based on sapphire for high temperature applications (Pressure measurement under harsh environments)

2 Intro What: pressure sensor Pt thin film metallization
Why: harsh environment thus high p high T agressive media Where: gasturbines, dieselengines, … How: Wheatstone bridge signal increases with high p signal decreases with high T

3 Intro Properties: negative drift -30ppm(max) at full p and T
sensitivity ±10µV/V.bar Problem: monitoring high p and T in combustion engines in presence of harsh environments. This means limited use of Si based MEMS (Micro Electro Mechanical System) Low stability of Ohmic contacts Different materials with different temperature dependence

4 Sensor system Device: membrane bodies are micromachined using ultrasonic drilling which is less time and costconsuming and has less transfer of mechanical stress Strain gauge 1µm thick Pt film which is putter deposited Ar based dry etching technique to create Wheatstone bridge

5 Sensor system Packaging: Package:Ni based superalloy
Substrate(layer of deposition): sapphire (not longer Si based like SiC) Interconnects:Pt pins kept in position by gold coated Inconel springs Electrical interconnects implemented in a glass ceramic part Sealing of the package to the sensor device as to the glass ceramic body by gold coated Wills rings

6 Schematic

7 Sensor characterisation
N2 is fed to an oven Static pressure measurements measured from room temperature to 300°C Temperature of the gas is measured by type K thermocouple, the device by thermoresistive thin film element Pressure from ambient pressure to 100 bar Reference by digital pressure gauge

8 Results(pressure)

9 Results(temperature)

10 Results(pressure) Outputcharacteristic is linear from 0 to over 100bar
Temperature increase doesn’t change the linearity At low pressure offset -17ppm At high pressure offset -29ppm

11 Results (temperature)
At low temperature no offset At high temperature offset -15ppm Caused by thermomechanical stress between package and sensor Asymmetric geometry of the sensor device Decrease in sensitivity (11.12 to 9.32µV/V.bar) with increasing T

12 Conclusion Succesfull measurements between 100bar and 300°C
Linear dependence on applied pressure over large T-range Only static measurements, NOT dynamic Improvements by research on the package


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