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CMOS Process Flow
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1- Wafer Selection and Cleaning
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2- Active Region Formation LOCOS Process
3 2 1 4 5 6
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2- Active Region Formation LOCOS Process
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3- N and P Well Formation 1 2 3 Done in 2 ways 4
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4- Vth Adjustment (Field Implant)
1 2 3
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Removal of Gate Oxide Layer
5- Polysilicon Formation (Gate) 3 1 2 Removal of Gate Oxide Layer Gate Oxide Re-growth Deposition of Polysilicon Electrode 4 Polysilicon Etching Why did we leave the SiO2 from the beginning? To avoid channeling The SiO2 atoms are amorphous so the ions are randomized and stop when they hit an atom. The P- type silicon is single crystalline.
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6- Lightly Doped Drain N+ N- P instead of N+ P to avoid high electric field between N+ and P 1 2 Self Alignment The polysilicon gate is used to align the drain and source without using a mask
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Formation of Sidewall Spacer
1 2 3 Deposition of “Screen” Oxide Layer
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7- Formation of Source and Drain
1 2
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8- Annealing (Drive in Process)
Very high temperature then cooling to relax the bonds in the material 1 2
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9- Metal Interconnect 1 2 3 5 6 4 Ti N2
Titanium and N+ form titanium-silica which is a very good conductor Titanium and Nitrogen form titanium-nitride which is also a conductor 1 2 3 Ti N2 5 6 4 Planarization by Chemical Mechanical Polishing (CMP)
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9- Metal Interconnect 8 7 Open holes for via
Why is the annealing done before the metal interconnect? Because the metal will melt
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1 2 3 4 A heavily doped P substrate is chosen
A lightly doped layer is grown on top Active Region Formation (LOCOS) and P implant 3 4 N well Formation High Temperature to complete N well Formation
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5 6 7 8 Vth Adjustment (Field Implant) Vth Adjustment (Field Implant)
Polysilicon Deposition
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10 9 11 Gates Source and Drain Formation (Self Alignment)
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