1. 6th WorldFIP Insourcing Meeting
Progress Report
Eva. Gousiou BE/CO-HT
& the nanoFIP team
nan FIP

2. Outline Main Design updates Results of the Preliminary Radiation Tests
Example application: nanoFIPDIAG
Next Steps

3. Outline Main Design updates Results of the Preliminary Radiation Tests
Example application: nanoFIPDIAG
Next Steps

4. Main Design Updates Added Power On Reset input pin
Updated turnaround times based on measurements on microFIP chips configured with the fastest settings
Removed “Read” access rights from the Produced memory
Synthesis with Precision Rad-Tol : Localized TMR and Fail-safe state machines

5. Main Design Updates nan FIP
Completed validation with independent Simulation Test Bench by G.Penacoba (TE/CRG)
nan FIP
Millions of cycles exhaustive testing with J. Palluel’s (BE/ CO) software
V2 testing board including the project’s extension with JTAG
Currently 19 V2 agents running continuously in our lab
Extensive 5-days code review in Jan 2011 by 5 designer experts from 2 different groups (

6. Outline Main Design updates Results of the Preliminary Radiation Tests
Example application: nanoFIPDIAG
Next Steps

7. Radiation Testing Campaigns
Preliminary test : 2 prototype boards after 2 weeks of dry run tests on April 15th
1 Mbps: 2 boards 5ms & 500ms macrocycle
Massive tests: 10 boards after 1 month of dry run tests May-June
31.5 Kbps : 2 boards 5ms & 500ms macrocycle
1 Mbps : 3 boards
2.5 Mbps : 5 boards
Extra tests: Irradiation of the nanoFIP, FIELDRIVE & the FIELDTR;
Study of the effects of high temperature while irradiating

8. nanoFIP Preliminary Radiation Tests at PSI Test Setup
user
nanoFIP
WorldFIP
Master
Field TR
Fiel
drive
WorldFIP FIELDBUS

9. nanoFIP Preliminary Radiation Tests at PSI Test Setup
Control Room
user
nanoFIP
WorldFIP
Master
Field TR
Fiel
drive
WorldFIP FIELDBUS

10. nanoFIP Preliminary Radiation Tests at PSI Test Setup
Control Room 9V
50m
nanoFIP
user
WorldFIP
Master
Field TR
Fiel
drive
WorldFIP FIELDBUS

11. nanoFIP Preliminary Radiation Tests at PSI Test Setup
Control Room
RS 232
50m 9V
50m
nanoFIP
user
WorldFIP
Master
Field TR
Fiel
drive
WorldFIP FIELDBUS

12. nanoFIP Preliminary Radiation Tests at PSI Test Setup
2 nanoFIP chips at 1 Mbps bit rate irradiated
Use of the entire Produced and Consumed memory of nanoFIP
5ms and 500ms macrocycles
PSI facility 230 MeV p+ beam
nanoFIP
p+ beam
p+ beam

13. nanoFIP Preliminary Radiation Tests at PSI Test Results
Correct frames exchange until ~400 Gy; no SEE
At ~400 Gy no frame was being received by the Master; chips not responding
Soft reset / power cycle not able to recover the functionality
JTAG scan chain giving errors
Several hours later the chips were fully functional
“The instabilities were always accompanied by an increase of the current in the FPGA core from 1 to 33 mA.”
Radiation-Tolerant ProASIC3 FPGAs Radiation Effects ACTEL report

14. FIELDRIVE Preliminary Radiation Tests at PSI Test Setup
Control Room
RS 232
<50m 9V
<50m
nanoFIP
user
WorldFIP
Master
Field TR
Fiel
drive
WorldFIP FIELDBUS

15. FIELDRIVE Preliminary Radiation Tests at PSI Test Results
1 set of FIELDRIVE/ FIELDTR at 1 Mbps bit rate
5 ms macrocycle
Testing stopped at 400 Gy due to beam time expiration
No error appeared throughout the testing
10 % current consumption increase

16. Outline Design updates Results of the Preliminary Radiation Tests
Example application: nanoFIPDIAG
Next Steps

17. Example application: nanoFIPDIAG
FIPDIAG: electronics module used for fieldbus diagnostic purposes
Test version: Use of the nanoFIP testing board with some extra cabling
Configuration: stand-alone mode, 1 Mbps bit rate
No software changes needed
Tests running successfully in the same segment with cryo agents
Official version: assigned to HLP; First modules expected Q3 2011

18. Outline Design updates Results of the Preliminary Radiation Tests
Example application: nanoFIPDIAG
Next Steps

19. Next Steps Support to your designs!
Final firmware code review next week; Code “freezing”
“Massive” and “Extra” radiation tests
Support to your designs!

20. 6th WorldFIP Insourcing Meeting
Extras

21. nanoFIP Radiation Tests at PSI
user
nanoFIP
WorldFIP
Master
Field TR
Fiel
drive
WorldFIP FIELDBUS

22. nanoFIP Radiation Tests at PSI
user
nanoFIP
Cons
WorldFIP
Master
Field TR
Fiel
drive
WorldFIP FIELDBUS

23. nanoFIP Radiation Tests at PSI
user
nanoFIP
Prod
Cons
WorldFIP
Master
Field TR
Fiel
drive
WorldFIP FIELDBUS

24. Irradiation of 10 devices
Target Cross Section
LHC
5000 nanoFIPs in the LHC
< 10 SEE / year
σ nanoFIP < 1e-13 cm2
PSI facility, p+ 250MeV
2e9 p+/cm2/ Gy
Irradiation of 10 devices
300 Gy lifetime of an Actel ProASIC3 device