1. LNF - Beam Test Facility Apr. 28 – May 03
SiPm detectors characterization

2. Beam Characteristics 500MeV electrons Repetition Rate 50 Hz
Pulse Duration 1-10 ns
Current/pulse 1 to 8 particles
σXY ~2mm
Max Electronic Rate: 1KHz

3. December 2004 Setup - Mechanics
SiPm
Beam
line
Beam Profilometer
BTF Calorimeter

4. Setup - Electronics 4x SiPm Calo Raffaele.Bencardino@roma2.infn.it
Beam Trigger
66.6 V 4x
Power
Supply
SiPm
Beam
Calorimeter
CAMAC
LinearFanin
Fanout
Delay
units
12 bit ADC
SiPm
Calo
Ext.TRG
Beam Trigger
Acquisition System
CAMAC
Discriminator
Scaler

5. Data analysis - First View
ADC channels
Countings
Beam
Calorimeter

6. Data analysis - First View
Full SiPm acquisition
Countings
ADC channels

7. SiPm: 1e- contribution σ=12.8 Countings <N>=82.9 ADC channels

8. SiPm: 2e- contribution Countings ADC channels

9. SiPm: 3e- contribution Countings ADC channels

10. Linear Energy Deposition
ADC channels
Electrons multiplicity

11. Data from Lazio SiPm Beam Countings Countings ADC channels
File 27_11_04_13
Beam T1 T2
Countings
Countings
ADC channels
ADC channels

12. First SiPm plane: linearity
1e- T1 plane
2e- T1 plane

13. Second SiPm plane: non-linearity
1e- T2 plane
2e- T2 plane

14. May 2005 – Beam Test Setup S1 T1 T2 S2 Beam

15. Full data ACQ File 200505021244: SiPm T1 and T2: Low voltage
Hi voltage

16. SiPm 1e- contrib. File 200505021244: Obs.:
The energy deposition and the data
STD increase with the voltage

17. SiPm 2e- contrib. File 200505021244: Obs.:
The energy deposition and the data
STD increase with the voltage
The energy loss don’t depend on the
particles multiplicity

18. SiPm 3e- contrib. File 200505021244: Obs.:
The energy deposition and the data
STD increase with the voltage
The energy loss don’t depend on the
particles multiplicity

19. SiPm 4e- contrib. File 200505021244: Obs.:
The energy deposition and the data
STD increase with the voltage
The energy loss don’t depend on the
particles multiplicity

20. Conclusions Acquisition of larger statistic data
Acquisition of the ADC, TDC and SCALER in order to investigate the performances of the device
Quantify the differences between two Tiles
Characterization of the acquisition system
Acquisition with two indipendent parallel systems
Acquisition of larger statistic data