1. IEEE 1450 Working Group - A Status Report -
Name: Tony Taylor
Title: Co-Chairman

2. STIL: Conception
Dec 1994: first ad-hoc meeting called to create the Tools<>Testers Interface consortium, with the identified goals:
to address the “megabyte problem” of transporting test vectors from CAD to ATE
intended to be a Test format
to provide a solution quickly
EDA
vendors
customers
ATE
vendors

3. STIL: Delivery June 1996 October 1997 March 1999 Aug 1999:
IEEE accepted the Project
Authorization Request (PAR) P1450
October 1997
First IEEE ballot returns
March 1999
P1450 Approved as IEEE Std
Aug 1999:
IEEE Std 1450 in print

4. STIL Resources – available on web
Clarifications document to
Recommended usage document to
Basic lex/yacc parsing rules for STIL
Source code for STIL examples in
Web
Mail reflector

5. STIL working group - how to participate
Bi-weekly conference calls
Informal draft review
Formal IEEE ballot
IEEE is an open process
All information about our work is available on the IEEE web site

6. STIL Overview Definition of terms:
STIL = Standard Test Interface Language
CTL = Core Test Language
TRC = Test Resource Constraints
Set of standards
IEEE Std = Basic STIL
p = Design extension to STIL (90% complete)
p = DC Level extension to STIL (Ballot complete)
p = Tester Targeting (75% complete)
p = Flow extension to STIL (re-activated)
p = Test Method extension to STIL (not started)
p = Core Test Language extension to STIL (90% complete)
p1500 = Core Test Hardware Definition (75% complete)

7. STIL Standards 1450-1999 P1450.2 Published P1450.1 P1450.6 In Ballot
In Definition
P1450.5
…Pending

8. STIL Partitioning - Test Reqs
UserKeywords & Functions
Unused
Possibly used
Need to support
Pragma
Signals
SignalGroups
Spec
Selector
ScanStructures
BistStructures
CoreType
CoreInstance
CellGroups
Environment
Timing
DCLevels
DCSets
DCSequence
PatternBurst
PatternExec
Procedures
MacroDefs
Pattern
test 1 2 3 6

9. STIL Partitioning – ATPG Tool
UserKeywords & Functions
Unused
Possibly used
Need to support
Pragma
Signals
Single global
SignalGroups
Spec
Selector
Single global
ScanStructures
BistStructures
CoreType
CoreInstance
CellGroups
Environment
Single global, constant times
Timing
DCLevels
DCSets
DCSequence
Single named, single pattern ref
PatternBurst
Single global, single Timing and PatternBurst ref
PatternExec
Single global, possibly multiple Shifts
Procedures
Single global
MacroDefs
Single named, C{},V{}, W{}, Macro&Proc calls
Pattern
test
atpg 1 2 3 6

10. STIL Partitioning - Core Test
UserKeywords & Functions
Unused
Possibly used
Need to support
Pragma
Signals
Multiple named
SignalGroups
Spec
Selector
Multiple named
ScanStructures
BistStructures
CoreType
CoreInstance
CellGroups
Environment
Multiple named, constant times
Timing
DCLevels
DCSets
DCSequence
Multiple named, multiple & parallel pat ref
PatternBurst
Possibly Multiple
PatternExec
Multiple named
Procedures
MacroDefs
Multiple named
Pattern
Multiple named, Macro&Proc calls
test
atpg
ctl 1 2 3 6