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Development of a Response Index for Corn
Robert Mullen Ohio State University
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Response Index RI first proposed by Johnson and Raun, (inverse of sufficiency index) RI = Yield of N Rich / Yield of Check (0N) Direct measure of N response
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Response Index Can we reliably predict the response to applied N during the growing season? Environmentally and economically important Less N subject to denitrification, leaching, and runoff Produce more with less inputs Is the relationship stable at different stages of growth?
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Response Index In-season estimates of RI were used to identify RI at harvest for winter wheat
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Response Index Would RI for corn work as well?
Can RI be identified at early stages of growth (< V8)?
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Response Index Varvel et al., 1997
Used SPAD meters to identify N response at various stages of growth V6 – R3 Relationship has been established between GNDVI and SPAD meter reading (Shanahan et al., 2003)
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Can RI work for corn? Varvel data shows that pseudo-RI can be determined at various stages of growth Very little data for some stages of growth Lack of response at most locations (especially where corn followed soybeans)
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Can RI be estimated at early stages of growth?
Red NDVI determined significant difference between N rate at V4 N rate RNDVI 0.209 0.204 60 0.234 0.249 120 0.247 0.239 180 0.263 0.244 Linear P=0.0149 P=0.0319
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Can RI be estimated at early stages of growth?
Green and red NDVI determined differences between treatments at V6 N rate RNDVI GNDVI 0.531 0.437 60 0.654 0.530 120 0.664 0.546 180 0.678 0.540 Linear P=0.0001
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Discussion Practicality of N rich strip
Production scale agriculture without sophisticated sensors Answer N loss questions and helps make N application decisions
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Discussion The earlier, the better
Determination of RI early in the season would be better Lack of high-clearance application equipment Increase in application window
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Conclusions? Continue research to identify relationship between RI-NDVI and RI-Harvest for corn. “Calibrate” RI at various growth stages with N application rates if yield cannot be predicted accurately (this will be difficult). Encourage use of N rich strips in production fields to answer simple N application questions.
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Questions?
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