1. Reliability KPOH = Power-On hours for MTBF (thousand)
Vmax = Max permitted gate-dielectric voltage without overshoot
Vos = Maximum permitted overshoot voltage when used with a maximum dc level of Vh < Vmax

2. Reliability for NFET Temperature = 25ºC Temperature = 75ºC
Switching Probability to Vh = 50%
Tos = 50% of a switching cycle
Device Length = 50nm
Temperature = 75ºC
Vmax
Inversely proportional to KPOH
Inversely proportional to log of Device Size

3. Bias Generator for PVT variation

4. Layout

5. Cell Array

6. Cell Array