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OTA Metrics and Methodology
January 2995 doc.: IEEE /1531r0 July 2005 Date: OTA Metrics and Methodology Authors: Name Company Address Phone Fahd Pirzada Dell One Dell Way Round Rock, TX 78682 Pratik Mehta Neeraj Sharma Intel 13290 Evening Creek Drive San Diego, CA 92128 (858) Uriel Lemberger PO Box 1659, Matam Industrial Park, Haifa Israel Sasha Tolpin Nir Alon Amer Hassan Microsoft One Msft Way Richmond, WA 98052 (425) Notice: This document has been prepared to assist IEEE It is offered as a basis for discussion and is not binding on the contributing individual(s) or organization(s). The material in this document is subject to change in form and content after further study. The contributor(s) reserve(s) the right to add, amend or withdraw material contained herein. Release: The contributor grants a free, irrevocable license to the IEEE to incorporate material contained in this contribution, and any modifications thereof, in the creation of an IEEE Standards publication; to copyright in the IEEE’s name any IEEE Standards publication even though it may include portions of this contribution; and at the IEEE’s sole discretion to permit others to reproduce in whole or in part the resulting IEEE Standards publication. The contributor also acknowledges and accepts that this contribution may be made public by IEEE Patent Policy and Procedures: The contributor is familiar with the IEEE 802 Patent Policy and Procedures < ieee802.org/guides/bylaws/sb-bylaws.pdf>, including the statement "IEEE standards may include the known use of patent(s), including patent applications, provided the IEEE receives assurance from the patent holder or applicant with respect to patents essential for compliance with both mandatory and optional portions of the standard." Early disclosure to the Working Group of patent information that might be relevant to the standard is essential to reduce the possibility for delays in the development process and increase the likelihood that the draft publication will be approved for publication. Please notify the Chair as early as possible, in written or electronic form, if patented technology (or technology under patent application) might be incorporated into a draft standard being developed within the IEEE Working Group. If you have questions, contact the IEEE Patent Committee Administrator at Fahd Pirzada - Dell Bruce Kraemer, Conexant
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Agenda OTA Test Environments
July 2005 Agenda OTA Test Environments OTA in Shielded Enclosure OTA Indoor NLOS OTA Indoor LOS OTA Outdoor LOS OTA Throughput versus Attenuation in Shielded Enclosure OTA Throughput versus Range in Indoor LOS Test Environment Conclusion Throughput versus Attenuation Throughput versus Range Fahd Pirzada - Dell
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OTA in Shielded Enclosure
July 2005 OTA in Shielded Enclosure Throughput numbers generated by end-to-end measurement tools e.g. using Chariot, Netperf, etc. Turn-table allows averaging of throughput over various orientations WLCP base line parameters defined in proposal: Max Tx Power, RTS threshold, QoS, etc. Fahd Pirzada - Dell
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Throughput versus Attenuation
July 2005 Throughput versus Attenuation Total Setup Path Loss = Cable Losses Equipment Losses Free Space Path Loss Attenuation (dB) Direction of traffic flow (Downlink or uplink) 802.11a Maximum Throughput (Mbps) Minimum Throughput (Mbps) Average Throughput (Mbps) Distance between DUT & Antenna (feet) Total Setup Path Loss (dB) Downlink 19.03 17.87 18.49 32 58.2 Attenuation (dB) Direction of traffic flow (Downlink or uplink) 802.11g Maximum Throughput (Mbps) Minimum Throughput (Mbps) Average Throughput (Mbps) Distance between DUT & Antenna (feet) Total Setup Path Loss (dB) Downlink 17.91 17.04 17.26 32 56.9 Fahd Pirzada - Dell
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Throughput vs. Attenuation Data Variation
July 2005 Throughput vs. Attenuation Data Variation Data collected on a off-the-shelf a/b/g NIC Data collected at three different times with the same DUT % variation = (Max Throughput – Min Throughput) / Avg. Throughput Fahd Pirzada - Dell
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OTA Indoor/Outdoor Test Environment
July 2005 OTA Indoor/Outdoor Test Environment Traffic Generator Wireless Counterpart Device under Test Upload Obstruction (if any) Download Turn Table x meters y meters Test Parameters: DUT test height Location of DUT and WLCP DUT lid/LCD angle In-band noise DUT XY placement accuracy Consistent test equipment DUT spinning Climate WLCP test height and orientation The variability (error margin) between the three test runs is reported for each configuration tested. This reported error margin should be below 5% for the first value of range (shortest distance between DUT and WLCP) This reported error margin should be below 15% for the last value of range Fahd Pirzada - Dell
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Outdoor Throughput versus Range
July 2005 Outdoor Throughput versus Range Range (feet) Direction of traffic flow (Downlink or uplink) Maximum g Throughput (Mbps) Minimum g Throughput (Mbps) Average g Throughput LOS or non-LOS Environment If non-LOS, details (number/type) about the obstructions 30 Downlink 15.83 13.42 14.39 LOS Fahd Pirzada - Dell
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Indoor non-LOS Data Variation (run-to-run)
July 2005 Indoor non-LOS Data Variation (run-to-run) Data collected on a off-the-shelf a/b/g NIC Data collected for 3 runs each time % variation = (Max Throughput – Min Throughput) / Avg. Throughput Mode STA x 6 meters*, no obstructions STA y 41 meters*, 0 walls, and 12 cubes STA z 58 meters*, 3 walls, and 12 cubes 802.11b – Rx 0.94% 0.48% 0.28% 802.11b – Tx 0.15% 0.54% 0.11% 802.11g – Rx 0.45% 1.72% 1.77% 802.11g - Tx 0.21% 1.96% 1.54% * Linear distance from the AP Fahd Pirzada - Dell
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Outdoor LOS Data Variation (run-to-run)
July 2005 Outdoor LOS Data Variation (run-to-run) Data collected on a off-the-shelf a/b/g NIC Data collected for 3 runs each time % variation = (Max Throughput – Min Throughput) / Avg. Throughput Mode 10 meters 50 meters 100 meters 200 meters b - Rx 0.21% 0.07% 0.09% 1.41% b - Tx 0.05% 0.03% 0.08% 1.74% g - Rx 0.5% 0.07 5.84% g - Tx 1.16% 0.10% 12.07% * Linear distance from the AP Fahd Pirzada - Dell
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Conclusion Over-the-air (OTA) environments allows us to:
July 2005 Conclusion Over-the-air (OTA) environments allows us to: Evaluate antenna, device and overall system wireless performance Perform comparisons between various systems Perform correlation to real-life usage scenarios We have done detailed testing in indoor/outdoor test environments to correlate our data from the OTA shielded enclosure setup The results from indoor/outdoor testing provides acceptable level of repeatability within the same test environment Fahd Pirzada - Dell
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