1. Design and Survivability Analysis of a 5GHz Operational Amplifier
Jane Doe, John Smith, Al Bean
XYZ Enterprises, Inc. Seattle, WA
Abstract: This poster describes the circuit design and operation of a 5GHz operational amplifier. This integrated circuit is targeted for military applications in harsh environments. Modeling and experiments demonstrate the opamp’s consistent performance over a spectrum of mission requirements.
Results and Analysis
Linear operation from DC to 5Ghz
Frequency degradation observed at temperatures above 100C
No single event latchup observed
Modeling agreed with experimental data within 10 percent
Modeling Data Plot 1
Introduction and Motivation
Figure showing opamp circuit
Opamps critical for precision analog control systems
High performance opmps rarely meet survivability requirements
Advanced microelectronic device technologies enable high-performance, robust circuit designs for military defense articles
Modeling Data Plot 2
Experimental Data Graph 1
Figure showing electrical subsystem
Experimental Data Graph 2
Conclusions
Experimental Methods
New opamp enables high bandwidth operation in harsh environments
New opamp in service for five years on the ULTF Program
No operational upsets
Continued performance within original specifications
Modeling conducted using the Foobar simulator, release version 10.4
Electrical testing conducted at XYZ Enterprises integrated circuits laboratory in Seattle, WA.
Milspec temp range
Undervoltage/Overvoltage
ESD
Radiation testing conducted at the MNO Cyclotron.
Milspec A followed
Single Event Upset, Single Event Latchup
Photograph of test setup
Photograph of Jane Doe
Photograph of John Smith
Photograph of Al Bean
XYZ Enterprises Logo
Jane Doe
John Smith
Al Bean
This work was sponsored by the ABC Agency under contract ABC Opinions, interpretations, conclusions, and recommendations are those of the authors and are not necessarily endorsed by the United States Government.
Direct technical inquiries regarding this poster to Jane Doe via at or by telephone at