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Published byDenis Singleton Modified over 6 years ago
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CMOS Devices PN junctions and diodes NMOS and PMOS transistors
Resistors Capacitors Inductors Bipolar transistors
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The MOS Transistors
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The MOS Transistors
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CMOS Device Model Objective CMOS transistor models
Hand calculations for analog design Non-idealities and their effects Efficient and accurate simulation CMOS transistor models Large signal model Small signal model Simulation model Noise model
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Good for VDS <VGS-VTH
After that, ID become saturated.
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Linear in deep triode As vDS 0, ron
Pro: voltage control of resistivity. Con: nonlinear resistor.
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MOST Regions of Operation
Cut-off, or non-conducting: vGS <VT iD=0 approximately Conducting, or on: vGS >=VT Saturation: vDS > vGS – VT Triode or linear or ohmic or non-saturation: vDS <= vGS – VT Saturation voltage:
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With channel length modulation
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iD vs vDS for several VGS
gds gm*DVGS
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Influence of Channel Length on l
Lmin = 0.25 Johns and Martin book gives an approximate formula with l 1/L At >=2*Lmin, l is small, Ro is large After 1um, l remains about the same
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Influence of VBS VBS changes threshold voltage, and hence changes i-v curve.
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Temperature Dependence of Mobility
Linear Temperature Dependence of threshold voltage Saturation Velocity Junction capacitance Barrier potential Drain resistance
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This is nonlinear if Vbs is temperature dependent
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Referenced from Filanovsky’s paper
0.35um process ZTC biasing Referenced from Filanovsky’s paper
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Reality: no single point crossing
Not just one single crossing ID In AMI0.6 process Test on a single NMOS biased with fixed Vgs and Vds Vgs
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To refine the value AMI 0.6 Vgs=1.12V Vgs=1.14V Optimum curve
TC = 41 ppm/C Vgs=1.17V
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Generic 018 Vgs=0.717V Vgs=0.721V TC=27 ppm/C Vgs=0.727V
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Large signal model for approximate hand caculation
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Capacitors Of The MOSFET
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Capacitors in Cutoff
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Capacitors in Saturation
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Capacitors in Triode
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Small signal model
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Typically: VDB, VSB are in such a way that there is a reversely biased pn junction.
Therefore: gbd ≈ gbs ≈ 0
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In saturation: But
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Intrinsic DC voltage gain: gm/gds = gm*rds
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In non-saturation region
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Intrinsic gain For large gain, use small ID or small over drive voltage, or in moderate to weak inversion.
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High Frequency Figure of Merit wT
AC current source input to G AC short S, D, B to gnd (i.e. constant voltages) Measure AC drain current output Calculate current gain Find frequency at which current gain = 1. Ignore rs and rd, Cbs, Cbd, gds, gbs, gbd all have zero voltage drop and hence zero current Vgs = Iin /jw(Cgs+Cgb+Cgd) ≈ Iin /jw(Cgs+Cgd) Io = − (gm − jwCgd)Vgs ≈ − gm Iin /jw(Cgs+Cgd) |Io/Iin| = |gm − jwCgd|/w(Cgs+Cgd) ≈ gm/w(Cgs+Cgd)
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amplification |Io/Iin| attenuation wT 0 dB w
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At wT, current gain =1 wT ≈ gm/(Cgs+Cgd)≈ gm/Cgs or
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For fastest operation, use Vod near but before fT peak
For power efficiency, use Vod before fT corner
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High Frequency Figures of Merit wmax
AC current source input to G AC short S, B to gnd Measure AC power into the gate Assume complex conjugate load Compute max power delivered by the transistor Find maximum power gain Find frequency at which power gain = 1.
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gdo vs gm in short channel
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gdo vs gm in short channel
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Insights: gdo increases all the way with current density Iden
gm saturates when Iden larger than 100mA/mm Velocity saturation, mobility degradation ---- short channel effects Low gm/current efficiency High linearity For power efficiency and gm efficiency Use moderate to low current density Use small over drive voltage
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To Av: (W/L), m, ID, l, set VoQ at mid rail For high speed: Veff, m; L, Cgd, rg For better linearity: Vds, Vdb, set VoQ at mid rail Veff range: <~0.5V; or <~0.3V for efficiency ID/W range: <100mA/mm; or <40mA/mm for efficiency
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Intrinsic voltage gain of MOSFET
Sweep V1 Measure vgs Intrinsic voltage gain = gm/go = Dvds/Dvgs for constant Id
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Weak inversion When VGS is reduced to Vth, the drain current does not go to zero It does not follow square law It does not follow exponential law When VGS is markedly below Vth, the drain current becomes an exponential function of VGS. Behaves very much like a diode
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A model from weak to strong inv
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In strong inversion In strong inversion, n is about 1
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In weak inversion
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In weak inversion If vt = 25mV, n=2, gm/ID = 20 n=1.5, gm/ID = 27
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ID vs VGS Exponential model Square law model simulation
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ID/(W/L) vs VG is sensitive to VBS
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gm/ID vs VG is also sensitive to VBS
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But gm/ID vs ID/(W/L) has fixed shape
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Related VDD insensitive circuits
Filanovsky, etc, “Mutual Compensation of Mobility and Threshold Voltage Temperature Effects with Applications in CMOS Circuits”. G. Giustolisi “A Low-Voltage Low-Power Voltage Reference Based on Subthreshold MOSFETs”. Ka Nang Leung “A CMOS Voltage Reference Based on Weighted VGS for CMOS Low-Dropout Linear Regulators”. Bernhard Boser. “Analog Circuit Design with Submicron Transistors". IEEE SSCS Meeting, Santa Clara Valley, May 2005.
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TSMC 0.18 um Process
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TSMC 0.18 um Process
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TSMC 0.18 um Process
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TSMC 0.18 um Process
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TSMC 0.18 um Process
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TSMC 0.18 um Process
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