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Wieman: 1 LBNL Use Fe55 x ray count rates to determine if photo gate is collecting charge from thin P well layer or from the full epi layer.

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Presentation on theme: "Wieman: 1 LBNL Use Fe55 x ray count rates to determine if photo gate is collecting charge from thin P well layer or from the full epi layer."— Presentation transcript:

1 Wieman: 1 LBNL Use Fe55 x ray count rates to determine if photo gate is collecting charge from thin P well layer or from the full epi layer

2 Wieman: 2 LBNL First silicon tests, comparing photo-gate with standard diode structure Photo-gate directly to sense node drain Output signal for Fe 55 X-ray test ADC Linear ADC Log diode Photo-gate 1 Photo-gate 2 diode - full charge collection

3 Wieman: 3 LBNL Assumptions and volumes Depletion depth 0.8 m Epi thickness 8 m P well depth (need better number) 2 m Depleted diode volume 68 m 3 Photo Gate P well volume 700 m 3 Photo Gate epi volume 2800 m 3

4 Wieman: 4 LBNL Ratios Photo gate cts (sec 5 cts above ADC=100)/ Diode cts in peak 350 Volume Photo Gate depleted/ Diode depleted 27 Volume Photo Gate P well/ Diode depleted 68 Volume Photo Gate epi/ Diode depeted 270 Conclusion: Full volume of epi under photo gate is contributing signal

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