1. ATML Status April 2008 Issue 15
An overview of the ATML activity in the ATML focus group and as part of the IEEE SCC20 sub-committees

2. ATML
ATML’s mission is to define a collection of XML-based schemas that allows ATE and test information to be exchanged in a common format adhering to the XML standard
ATML defines a framework through which different architectures using XML can be implemented.
defines the components from which users can build their architectures, whilst being interoperable with other compliant architectures.
Show examples of the net centric services by which this information can be exchanged across different ATS platforms as part of a maintenance process.
defines the XML format that these elements.
The ATML specifications will define:
How to define XML schemas that represent ATE and test information.
A set of XML schemas supporting the exchange of specific ATE and test information.
The ATML specifications will support:
services that can be used for exchanging ATE and test information in a distributed net-centric environment.
services supporting the exchange of specific ATE and test information in specific common areas.

3. ATML ATML Overview and Architecture IEEE Std 1671 - 2006
Signal Descriptions :
STD
IEEE Std
1641 -
2004
Instrument Description (
1671 . 2 )
Test Station (
1671 . 6 )
Key :
In IEEE Ballot Process
Draft of the Standard
Standard approved by the
IEEE
Errata to Standard
approved by the IEEE
Draft revision of a standard
Started
Test Adapter (
1671 . 5 )
Diagnostics : AI -
ESTATE
Test Configuration
IEEE Std
1232 -
2002
IEEE Std
1671 . 4 -
2008
UUT Description
IEEE Std
1671 . 3 -
2008
Test Description (
1671 . 1 )
SIMICA Maintenance
Action Information (
1636 . 2 )
SIMICA Test Results and Session Information
IEEE Std
1636 . 1 -
2007
ATML Common ,
HardwareCommon ,
TestEquipment ,
and Capabilities (
1671 )

4. SCC20 & ATML Organisations
The IEEE SCC20 is the standards organisation through which the ATML components (i.e. schemas and documentation) will be published under various IEEE standards.
The ATML organisation is an open, independent focus group contributed to by the ATE industry and government agencies to advance the common exchange of test information through the use of XML.
The ATML group provides draft schemas and associated documents, examples, use cases, requirements and conducts trial use of any ATML components.
Their findings are submitted to the various SCC20 sub-committees and working groups to advance the IEEE standards associated with the ATML components.

5. SCC20 Organisation for 2008 Common , HardwareCommon TestEquipment Key:
Synthetic Instruments
UpConverter
DownConverter
ARB
Digitizer
Capabilities
SCC 20
Steering and Administrative
Chair
Mike Seavey (
Northrop Grumman )
Vice Chair
John Sheppard
Johns Hopkins University
Secretary
Dave Droste
DRS -
TEM
Liaisons CS
Joe Stanco
&
Mark Kaufman I M
AES
Bill Ross
DoD
Malcolm Brown
MoD
Les Orlidge
NDIA
Administrative
ADMIN
AAI
Hardware Interfaces HI Co
Mike Stora
SysIntech
Diagnostic and Maintenance Control
DMC
Tim Wilmering
Boeing
NWSC /
Corona
Johns Hopkins
University
Test and ATS Description
TAD
Ashley Hulme
EADS
Ion Neag
Reston Software
Test Information Integration
TII
Teresa Lopes
Teradyne
Chris Gorringe
John Ralph
IEEE
1505
Receiver Fixture Interface
RFI P . 1
Common Test Interface Pin
Map
1522
Testability and
Diagnosability
1232 AI
ESTATE
1636
SIMICA
Test Results and Session
Information 2
MAI
1546
DTIF Guide
1445
DTIF
1641
STD
716 C
ATLAS
771
Guide to the use of ATLAS
Guide to the use of STD
1671
Test Description
Instrument Description
ATML Overview and
Architecture 3
UUT Description 4
Test Configuration 5
Test Adapter 6
Test Station
ATML Component
Errata
Synthetic Instrument Annexes
Tier RFI
IEEE Staff Liaison
Soo H
Kim S H @
ORG
Pins
Ports
Connectors
Proposed
ATML Users Guide

6. ATML’s 2008 Objectives & Goals
To have the P (Instrument Description) Trial-Use Standard:
complete the formal ballot process by May 2008
to submit as a trial-use standard by Q3 2008
To have the P (Test Adapter) Trial-Use Standard:
complete the formal ballot process by Jul 2008
To have the P (Test Station) Trial-Use Standard:
To have the P (Test Description) Trial-Use Standard:
written, reviewed and to start the formal ballot process by May 2008
Ready for publication Dec 2008
to submit as a trial-use standard by Q5 2008

7. ATML’s 2008 Objectives & Goals (cont)
Review associated candidate schemas for all ATML components Q1
Signal Description (STD ) Errata v2 Q3
Update & errata for draft full use standard Q4
Signal Description (STD ) Dec 2008 Start Ballot
Review All IEEE Std 1671 ATML Components (P thru P & P1636.1) in line with 1671 draft Full Use Standard

8. Standards & Schema Revisions (1 of 2)

9. Standards & Schema Revisions (2 of 2)

10. ATML Overview & Architecture (IEEE Std 1671-2006)
Published December 16, 2006
Common schema Version 1.01
HardwareCommon Version 1.01
Errata Document to “replace” published Annex B
Presently at Draft 10
Errata until 2009; to be posted on IEEE Errata web-site
Common schema Version 2.01
HardwareCommon schema Version 2.02
TestEquipment schema Version 0.16
Published IEEE Std 1671™-2006 did not include Test Equipment

11. ATML Overview & Architecture (cont)
ATML Capabilities
Proposed as “new” Annex C
Errata to IEEE Std 1671 until 2009; to be posted on IEEE Errata web-site
Annex Document presently at Draft 1.1
Capabilities schema Version 0.04
ATML Pins, Ports, Connectors
Material to be posted on the TII web-site
Future ATML Users Guide

12. ATML Test Description (P1671.1)
Task
Date (month/day/year)
Draft Standard
Draft 2.0 will be available for review on 5th May 08
Upload Draft Document to IEEE MEC
April 08
MEC Approval
Invitation to Ballot
11th April 08
Initiate Ballot
May 08
Ballot Closed
Initial Ballot Results -

13. ATML Instrument Description (P1671.2)
Task
Date (month/day/year)
Draft Standard
Draft 6: 09/04/07 Incorporates Synthetic Instruments as Annexes: Up-converter, Down-Converter, ARB, Digitizer
Upload Draft Document to IEEE MEC
09/04/07
MEC Approval
10/12/07
Invitation to Ballot
10/22/07 (Closed 11/15/07)
Initiate Ballot
Draft 8: 11/28/07
Ballot Closed
01/14/08
Initial Ballot Results –Passed
Number of Balloters = 45
44 Responded 97.8% (≥ 75% of balloters)
Affirmative = 36
Negative = 4
Abstain = 4
Approval Rate 90.0% (≥ 75% of returned ballots)
Abstain Rate 9.1%
Number of Comments = 553 (572)

14. ATML Instrument Description (cont)
Task
Date (month/day/year)
Ballot Resolution
01/15/08-TBD
Re-Circulation Ballot
17th April 2008
Re-Circulation Ballot Closes
2nd May 2008
Recirculation Ballot Results
No comments – thus far
IEEE RevCom Submittal Package
IEEE RevCom Meeting

15. ATML UUT Description (IEEE Std 1671.3-2008)
Task
Date (month/day/year)
Draft Standard
Draft 3: 03/03/07
Upload Draft Document to IEEE MEC
03/03/07
MEC Approval
04/04/07
Invitation to Ballot
04/25/07
Initiate Ballot
Draft 6: 06/13/07
Ballot Closed
07/13/07
Initial Ballot Results - Passed
Number of Balloters = 55
45 Responded 81.8% (≥ 75% of balloters)
Affirmative = 40
Negative = 2
Abstain =3
Approval Rate 95.2% (≥ 75% of returned ballots)
Abstain Rate 6.7%
Number of Comments = 118

16. ATML UUT Description (cont)
Task
Date (month/day/year)
Ballot Resolution
07/13/07-09/05/07
All 118 comments have been addressed Regardless of classification or vote
Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified.
Re-Circulation Ballot
Draft 8: 09/05/07
Re-Circulation Ballot Closed
09/14/07
Recirculation Ballot Results - Passed
Number of Balloters = 55
48 Responded 87.3% (≥ 75% of balloters)
Affirmative = 44
Negative = 2
Abstain =2 (1 Lack of time, 1 Other)
Approval Rate 95.7% (≥ 75% of returned ballots)
Abstain Rate 4.2%
Number of Additional Comments = 22
IEEE RevCom Submittal Package
10/09/07
IEEE RevCom Meeting - Approved
12/05/07 preliminary RevCom comments received/addressed November 2007

17. ATML UUT Description (cont)
Task
Date (month/day/year)
Copy-Edited Review package due
01/30/08
Comments & Corrections due
02/20/08
Target IEEE Publication date
03/28/08

18. ATML Test Configuration IEEE Std 1671.4-2008
Task
Date (month/day/year)
Draft Standard
Draft 3: 03/03/07
Upload Draft Document to IEEE MEC
03/03/07
MEC Approval
04/04/07
Invitation to Ballot
04/25/07
Initiate Ballot
Draft 6: 06/13/07
Ballot Closed
07/13/07
Initial Ballot Results - Passed
Number of Balloters = 54
44 Responded 81.5% (≥ 75% of balloters)
Affirmative = 39
Negative = 2
Abstain =3
Approval Rate 95.1% (≥ 75% of returned ballots)
Abstain Rate 6.8%
Number of Comments = 102

19. ATML Test Configuration (cont)
Task
Date (month/day/year)
Ballot Resolution
07/13/07-09/05/07
All 102 comments have been addressed Regardless of classification or vote
Re-circulation path has been taken. IEEE editors could not have resolved some of these comments on there own. The XML schema was modified.
Re-Circulation Ballot
Draft 9: 09/05/07
Re-Circulation Ballot Closed
09/14/07
Recirculation Ballot Results - Passed
Number of Balloters = 54
47 Responded 87.0% (≥ 75% of balloters)
Affirmative = 44
Negative = 1
Abstain =2 (1 Lack of time, 1 Other)
Approval Rate 97.8% (≥ 75% of returned ballots)
Abstain Rate 4.3%
Number of Additional Comments = 1
IEEE RevCom Submittal Package
10/02/07
IEEE RevCom Meeting - Approved
12/05/07 preliminary RevCom comments received/addressed November 2007

20. ATML Test Configuration (cont)
Task
Date (month/day/year)
Copy-Edited Review package due
03/05/08
Comments & Corrections due
03/26/08
Target IEEE Publication date
04/30/08

21. ATML Test Adapter (P1671.5) Task Date (month/day/year) Draft Standard
Upload Draft Document to IEEE MEC
10/01/07
MEC Approval
10/12/07
Invitation to Ballot
11/28/07 (Closed 12/28/07)
Initiate Ballot
13th Feb 2008
Ballot Closes
13th March 2008
Initial Ballot Results - Passed
Number of Balloters = 32
31 Responded 97% (≥ 75% of balloters)
Affirmative = 24
Negative = 3
Abstain =4
Approval Rate 88.98% (≥ 75% of returned ballots)
Abstain Rate 12.9%
Number of Comments = 73

22. Date (month/day/year)
Task
Date (month/day/year)
Ballot Resolution
04/22/08-05/22/08
All 73 comments have been addressed Regardless of classification or vote
Re-Circulation Ballot
Re-Circulation Ballot Closed
Recirculation Ballot Results - Passed
IEEE RevCom Submittal Package
IEEE RevCom Meeting - Approved

23. ATML Test Station (P1671.6) Task Date (month/day/year) Draft Standard
Upload Draft Document to IEEE MEC
10/01/07
MEC Approval
10/22/07
Invitation to Ballot
11/28/07 (Closed 12/28/07)
Initiate Ballot
13th Feb 2008
Ballot Closes
13th Mar 2008
Initial Ballot Results - Passed
Number of Balloters = 32
31 Responded 97% (≥ 75% of balloters)
Affirmative = 24
Negative = 3
Abstain =4
Approval Rate 88.98% (≥ 75% of returned ballots)
Abstain Rate 12.9%
Number of Comments = 105

24. Date (month/day/year)
Task
Date (month/day/year)
Ballot Resolution
04/22/08-05/22/08
All 105 comments have been addressed Regardless of classification or vote
Re-Circulation Ballot
Re-Circulation Ballot Closed
Recirculation Ballot Results - Passed
IEEE RevCom Submittal Package
IEEE RevCom Meeting - Approved

25. ATML & SIMICA(IEEE-1636.1) SIMICA:Test Results and Session Information
IEEE Std
TestResults schema Version 2.03

26. ATML & STD (IEEE-1641) STD: (Update to IEEE Std 1641-2004)
Draft updated standard under development
Draft updated schemas under development
Start Ballot December 2008

27. Balloting - Spanning Calendar Years
Clarification
Once the initial ballot begins, the ballot group is set until all rounds of balloting are finished.
Even if a ballotter does not renew his or her IEEE membership.
myProject and myBallot accounts remain active only for activities selected while IEEE membership was active.
myProject will indicate that IEEE membership has expired.
All votes and comments are valid, and are to be handled as any other IEEE-SA member.
The IEEE does not wish to re-establish balloting constituencies.

28. IEEE Std1671-2006 Schema & Document Locations

29. 2008 Meeting Schedule Face-to-Face Meetings: Additionally:
Jan ; Orlando, FL (Lockheed Martin)
Apr. 22nd-24th ; SCC St. Louis, MO (Boeing)
Jul. TBA; Open - meeting presently planned for Santa Rosa
6-8th Sept.; SCC Salt Lake City, UT
In conjunction with AUTOTESTCON (Sept. 8-11)
Oct./Nov. TBD; Open - no meeting presently planned
Additionally:
Bi-Weekly Teleconferences
4 Meetings a year plus additional break-out working groups as necessary
Synchronise with SCC20 meetings