1. IEEE SCC20 Standards Status
Standards Coordinating
Committee 20
SCC20
IEEE SCC20 Standards Status
With emphasis on the IEEE-1671 (ATML) Series of Standards
September 15, 2010
Mike Seavey
SCC20 Chair & 2010 Member of the IEEE Standards Board
AUTOTESTCON 2010

2. ATS Elements Supported by the Automatic Test Markup Language (ATML)

3. ATML Framework and
Sub Domains

4. ATS
Sub
Domains

5. Present ATML Series of Standards: IEEE-1671
ATML Overview and Architecture
IEEE Std
Full Use
ATML: Test Description
IEEE Std
Trial Use
ATML: Instrument Description
IEEE Std
ATML: UUT Description
IEEE Std
ATML: Test Configuration
IEEE Std
ATML: Test Adapter
IEEE Std
ATML: Test Station
IEEE Std
SIMICA Standards: IEEE-1636
Software Interface to Maintenance Information Collection and Analysis
IEEE Std
Trial Use
SIMICA: Test Results and Session Information
IEEE Std
SIMICA: Maintenance Action Information
IEEE P1636.2
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6. Some of the other SCC20 Standards
AI-ESTATE
IEEE Std
Full Use
STD
IEEE Std
RFI
IEEE Std
A revision to the Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE) standard is in process. It will be submitted to the IEEE Standards Board for approval in the near future
A revision to the Receiver Fixture Interface (RFI) standard is on the IEEE Standards Board agenda for approval

7. IEEE Download site for IEEE-1671 Series XML Schemas

8. What’s on the Horizon ? ATML Overview and Architecture
A revision to the 2006 publication (and associated XML schemas) has completed the IEEE ballot process
On the IEEE Standards Board agenda for approval
~120 page document is now over 420 pages
Each of the IEEE-1671 “dot” Standards
Revisions to each of the six standards and their associated XML schemas will be made “simultaneously”
SIMICA
A revision to the Test Results (IEEE Std ) publication (and associated XML schemas) has begun
IEEE-P is on the IEEE Standards Board agenda for approval