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ENGM 621: Statistical Process Control
Control Charts, Part I Variables
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Process Capability - Timing
Reduce Variability Identify Special Causes - Good (Incorporate) Improving Process Capability and Performance Characterize Stable Process Capability Head Off Shifts in Location, Spread Identify Special Causes - Bad (Remove) Continually Improve the System Process Capability Analysis is performed when there are NO special causes of variability present – ie. when the process is in a state of statistical control, as illustrated at this point. Time Center the Process LSL USL
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Shewhart’s Assumptions
The data generated by the process when it is in control: Are normally distributed Are independent Have a mean and standard deviation that are fixed and unknown
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Statistical Process Control
Originally developed by Walter Shewhart in 1924 at the Bell Telephone Laboratories Late 1920s, Harold Dodge and Harry Romig developed statistically based acceptance sampling Not recognized by industry until after World War II Shewhart was a contemporary of Deming and Juran Dodge and Romig also of Bell Labs statistically based acceptance sampling is an alternative to 100% inspection
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Common Causes Special Causes
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Histograms do not take into account changes over time.
Control charts can tell us when a process changes
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Data on Quality Characteristics
Attribute data Discrete Often a count of some type Variable data Continuous Often a measurement, such as length, voltage, or viscosity We will use statistical methods for both types
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Control Chart Concept Map
Quality Characteristic Q-Sum Chart n>10 n >1 Sm. shfts X, Moving R type of attribute ni = n p, np c pvar u X, S X, R no yes variable attribute defective defects
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Moving from Hypothesis Testing to Control Charts
A control chart is like a sideways hypothesis test Detects a shift in the process Heads-off costly errors by detecting trends 0 2 2-Sided Hypothesis Test Shewhart Control Chart Sideways Hypothesis Test CL LCL UCL Sample Number
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TM 720: Statistical Process Control
Test of Hypothesis A statistical hypothesis is a statement about the value of a parameter from a probability distribution. Ex. Test of Hypothesis on the Mean Say that a process is in-control if its’ mean is m0. In a test of hypothesis, use a sample of data from the process to see if it has a mean of m0 . Formally stated: H0: m = m0 (Process is in-control) HA: m ≠ m0 (Process is out-of-control) (c) D.H. Jensen & R.C. Wurl
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Test of Hypothesis on Mean (Variance Known)
TM 720: Statistical Process Control Test of Hypothesis on Mean (Variance Known) State the Hypothesis H0: m = m0 H1: m ≠ m0 Take random sample from process and compute appropriate test statistic Pick a Type I Error level (a) and find the critical value za/2 Reject H0 if |z0| > za/2 (c) D.H. Jensen & R.C. Wurl
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UCL and LCL are Equivalent to the Test of Hypothesis
TM 720: Statistical Process Control UCL and LCL are Equivalent to the Test of Hypothesis Reject H0 if: Case 1: Case 2: For 3-sigma limits za/2 = 3 (c) D.H. Jensen & R.C. Wurl
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Two Types of Errors May Occur When Testing a Hypothesis
TM 720: Statistical Process Control Two Types of Errors May Occur When Testing a Hypothesis Type I Error - a Reject H0 when we shouldn't Analogous to false alarm on control chart, i.e., point lays outside control limits but process is truly in-control Type II Error - b Fail to reject H0 when we should Analogous to insensitivity of control chart to problems, i.e., point does not lay outside control limits but process is never-the-less out-of-control (c) D.H. Jensen & R.C. Wurl
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Consequences of Incorrect Control Limits
TM 720: Statistical Process Control Consequences of Incorrect Control Limits Bad Thing 1: A control chart that never finds anything wrong with the process, but the process produces bad product Bad Thing 2: Too many false alarms destroy the operating personnel’s confidence in the control chart, and they stop using it (c) D.H. Jensen & R.C. Wurl
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Variation and Control A process that is operating with only common causes of variation is said to be in statistical control. A process operating in the presence of special or assignable cause is said to be out of control.
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Finding Trends and Special Causes
Inspection does not tell you about a problem until it becomes a problem We need a mechanism to help us spot special causes when they occur We need mechanism to help us determine when we have a trend in the data
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Control Chart Applications
Establish state of statistical control Monitor a process and signal when it goes out of control Determine process capability Note: Control charts will only detect the presence of assignable causes. Management, operator, and engineering action is necessary to eliminate the assignable cause.
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Capability Versus Control
Capable Not Capable In Control Out of Control IDEAL
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Control Charts x x n
We assume that the underlying distribution is normal with some mean and some constant but unknown standard deviation . Let n x x i n i 1
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Distribution of x s s = n x N ( , )
Recall that x is a function of random variables, so it also is a random variable with its own distribution. By the central limit theorem, we know that where, x N ( , ) x s s = x x n
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Control Charts x x x x
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Control Charts 3 UCL & LCL Set at
x x LCL UCL & LCL Set at Problem: How do we estimate & ? 3 x
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Control Charts m å x i x = i = 1 m m m å R R = i = 1 = f ( s ) s m
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å Control Charts å x x = ® m m R R = = f ( s ) ® s m UCL = D R LCL = D
i x = i = 1 m m m å R R = i = 1 = f ( s ) s m UCL = x + A R UCL = D R x 2 R 4 LCL = x - A R LCL = D R x 2 R 3
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Example Suppose specialized o-rings are to be manufactured at .5 inches. Too big and they won’t provide the necessary seal. Too little and they won’t fit on the shaft. Twenty samples of 2 rings each are taken. Results follow.
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Control Charts
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Control Charts
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X-Bar Control Charts X-bar charts can identify special causes of
variation, but they are only useful if the process is stable (common cause variation).
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Control Limits for Range
UCL = D4R = 3.268*.002 = .0065 LCL = D3 R = 0
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Why Monitor Both Process Mean and Process Variability?
TM 720: Statistical Process Control Why Monitor Both Process Mean and Process Variability? Process Over Time Control Charts X-bar R X-bar R X-bar R (c) D.H. Jensen & R.C. Wurl
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Teminology Causes of Variation: Meaning of Control: Assignable Causes
Keep the process from operating predictably Things that we can do something about Common / Chance Causes Random, inherent variation in the process Meaning of Control: In Specification Meets customer constraints on product In Statistical Control No Assignable Causes of variation present in the process
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Statistical Basis for Control Charts
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Statistical Basis of x Chart
TM 720: Statistical Process Control Statistical Basis of x Chart Suppose a quality characteristic is x ~ N(m, s) and we know m and s If x1, x2, …, xn is a random sample of size n then: and (c) D.H. Jensen & R.C. Wurl
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Statistical Basis of x Chart Cont'd
TM 720: Statistical Process Control Statistical Basis of x Chart Cont'd A 1-a confidence interval then is given by Which is equivalent to Where LCL and UCL are the lower and upper control limits, respectively (c) D.H. Jensen & R.C. Wurl
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Statistical Basis of X-bar
TM 720: Statistical Process Control Statistical Basis of X-bar R – the range – is a sample statistic If x1, x2, …, xn is a random sample of size n from a normal distribution then one can estimate using the sample standard deviation (if n is larger) or the average range for small samples: where d2 is a function of n and can be found in Appendix VI (c) D.H. Jensen & R.C. Wurl
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Statistical Basis of x-bar
If we replace 3 sigma hat of estimate for sigma hat, we get
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For n=2,
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TM 720: Statistical Process Control
For R-Chart General model for R chart (c) D.H. Jensen & R.C. Wurl
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For n=2,
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Identifying Shifts, Trends
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Shift in Process Average
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Identifying Potential Shifts
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Cycles
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Trend
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Western Electric Sensitizing Rules:
One point plots outside the 3-sigma control limits Two of three consecutive points plot outside the 2-sigma warning limits Four of five consecutive points plot beyond the 1-sigma limits A run of eight consecutive points plot on one side of the center line Western Electric Handbook, 1956
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Additional sensitizing rules:
Six points in a row are steadily increasing or decreasing Fifteen points in a row with 1-sigma limits (both above and below the center line) Fourteen points in a row alternating up and down Eight points in a row in both sides of the center line with none within the 1-sigma limits An unusual or nonrandom pattern in the data One of more points near a warning or control limit
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Special Variables Control Charts
x-bar and s charts x-chart for individuals
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X-bar and S charts Allows us to estimate the process standard deviation directly instead of indirectly through the use of the range R S chart limits: UCL = B6σ = B4*S-bar Center Line = c4σ = S-bar LCL = B5σ = B3*S-bar X-bar chart limits UCL = X-doublebar +A3S-bar Center line = X-doublebar LCL = X-doublebar -A3S-bar
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Operating Characteristic (OC) Curve
TM 720: Statistical Process Control Operating Characteristic (OC) Curve Ability of the x and R charts to detect shifts (sensitivity) is described by OC curves For x chart; say we know s Mean shifts from m0 (in-control value) to m1 = m0 +ks (out-of-control value) The probability of NOT detecting the shift on the first sample after shift is (c) D.H. Jensen & R.C. Wurl
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TM 720: Statistical Process Control
OC Curve for x Chart Plot of b vs. shift size (in std dev units) for various sample sizes n x chart not effective for small shift sizes, i.e., k 1.5s Performance gets better for larger n and larger shifts (k) (c) D.H. Jensen & R.C. Wurl
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Developing Control Charts
Prepare Choose measurement Determine how to collect data, sample size, and frequency of sampling Set up an initial control chart Collect Data Record data Calculate appropriate statistics Plot statistics on chart
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Next Steps Determine trial control limits
Center line (process average) Compute UCL, LCL Analyze and interpret results Determine if in control Eliminate out-of-control points Re-compute control limits as necessary
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Final Steps Use as a problem-solving tool Compute process capability
Continue to collect and plot data Take corrective action when necessary Compute process capability
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