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Professor Ronald L. Carter ronc@uta.edu http://www.uta.edu/ronc/
Semiconductor Device Modeling and Characterization EE5342, Lecture 13 -Sp 2002 Professor Ronald L. Carter L13 26Feb02
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npn BJT currents (F A region, ©RLC)
IC = JCAC IB=-(IE+IC ) JnE JnC IE = -JEAE JRB=JnE-JnC JpE JGC JRE JpC L13 26Feb02
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npn BJT topology x x’ p-Base n-Collector N-Emitter z WB WB+WC -WE x”c
Charge Neutral Region Depletion Region x x’ p-Base n-Collector N-Emitter z WB WB+WC -WE x”c x” xB x’E IE IC IB L13 26Feb02
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E current equations in FA mode npn BJT
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C current equations in FA mode npn BJT
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FA npn figure of merit emitter eff
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FA npn figure of merit base transp
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FA npn figure of merit recomb fact
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E current equations in npn BJT (w/o gen/rec)
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C current equations in npn BJT (w/o gen/rec)
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Common base current gain, a
aT d L13 26Feb02
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Common base current gain, a (cont.)
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Common emitter current gain, b
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Ebers-Moll Model (Neglecting G-R curr)
(Fig. 9.30* Semiconductor Physics & Devices, by Neamen, Irwin, Chicago, 1997, * throughout) -JEAE=IE JCAC=IC L13 26Feb02
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Ebers-Moll Model (No G-R curr)
-JEAE = IE JCAC = IC E B C aRIR aFIF (Fig Semiconductor Physics & Devices, by Neamen, Irwin, Chicago, 1997, * throughout) L13 26Feb02
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Source of Ebers- Moll Equations (E)
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Source of Ebers- Moll Equations (C)
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Recombination/Gen Currents (FA)
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Non-ideal effects in BJTs
Base-width modulation (FA: xB changes with changes in VBC) Current crowding in 2-dim base High-level injection (minority carriers g.t. dopant - especially in the base). Emitter Bandgap narrowing (NE ~ density of states at cond. band. edge) Junction breakdown at BC junction L13 26Feb02
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npn Base-width mod. (Early Effect)
Fig 9.15* L13 26Feb02
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Base-width modulation (Early Effect, cont.)
Fig 9.16* L13 26Feb02
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Emitter current crowding in base
Fig 9.21* L13 26Feb02
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Interdigitated base fixes emitter crowding
Fig 9.23* L13 26Feb02
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Non-ideal effects in BJTs
Base-width modulation (FA: xB changes with changes in VBC) Current crowding in 2-dim base High-level injection (minority carriers g.t. dopant - especially in the base). Emitter Bandgap narrowing for NE --> density of states at cond. band. edge Junction breakdown at BC junction L13 26Feb02
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Base region high- level injection (npn)
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Effect of HLI in npn base region
Fig 9.17* L13 26Feb02
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Effect of HLI in npn base region (cont)
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Effect of HLI in npn base region (cont)
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Emitter region high- level injection (npn)
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Effect of HLI in npn emitter region
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Effect of HLI in npn base region
Figs 9.18 and 9.19* L13 26Feb02
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Bandgap narrowing effects
Fig 9.20* Replaces ni2 throughout L13 26Feb02
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Junction breakdown at BC junction
Reach-through or punch-through when WCB and/or WEB become large enough to reduce xB to zero Avalanche breakdown when Emax at EB junction or CB junction reaches Ecrit. L13 26Feb02
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References * Semiconductor Physics & Devices, by Donald A. Neamen, Irwin, Chicago, 1997. L13 26Feb02
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