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Atomic Picture of Crystal Surfaces
Terraces, steps, kinks, adatoms and vacancies STM image of vicinal Si(111) STM image of Si(001)
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Three Growth Modes s > f + sf With misfit If s > f + sf
Film Substrate Layer-by-layer (Frank-Van der Merwe) 3D islanding (Volmer-Weber) Layer-by-layer followed by 3D islanding (Stranski-Krastanov) s: surface energy of substrate f: surface energy of film sf: interface energy of substrate-film
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Stranski-Krastanov growth of Ge on Si(001)
[100] pyramids huts Wetting layer ~ 2.5 ML Ge, 475 °C, (44nm)2 3D islands formation ~ 3.5 ML Ge, 475°C, (110nm)2
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MBE grown GaAs-AlxGa1-xAs superlattice
Bang gap – lattice constant for alloy semiconductors
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Misfit Dislocations Threading dislocation misfit dislocation
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Molecular Beam Epitaxy (MBE)
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Real-time monitoring of MBE using Reflection high-energy electron diffraction (RHEED)
3D growth RHEED Pattern Surface reconstruction Source off RHEED intensity oscillation
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Vapor Phase Epitaxy (VPE)
Horizontal reactor Vertical reactor Barrel reactor
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Liquid Phase Epitaxy (LPE)
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Carrier Mobility & Concentration Measurements
Hall Effect Doping Profile N(x) w I VH B x x Van der Pauw Test Pattern Depletion zone N(x) Schottky junction V C(V) = 0A/x
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