1. Mastering JMP® Analyzing and Reducing Spatial Defects
Michael D. Anderson, Ph.D.
JMP Systems Engineer

2. Working With Spatial Defect Data
CASE 1
Working With Spatial Defect Data

3. Working With Spatial Defect Data
Problem:
183,000 individual defect opportunities on our part.
Each opportunity has a specific spatial location.
Mfg process may produce defect clusters with distinct spatial signatures.
Findings:
Possible to reduce spatial defect data down to a few key clusters that we can correlate to our process for improvement activities.

4. CASE 2
Process Improvement

5. Process Improvement Problem: Findings:
Need to isolate a localized defect signature and provide insight back to the engineering community about potential root causes to focus mitigation efforts.
Findings:
Can correlate the defect signature back to 3 specific process steps within the manufacturing process.

6. Image Analysis and 3D Reconstruction
CASE 3
Image Analysis and 3D Reconstruction

7. Image Analysis and 3D Reconstruction
Problem:
Root cause analysis often requires detailed information about a defect and being able to spatially correlate different defects within a part.
Finding:
A 3D reconstruction of a defect demonstrates that the damage done to the back of the part is spatially related to the defect of interest in the middle of the part.