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Nicholas J. Savino Lynchburg College Department of Physics

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1 Nicholas J. Savino Lynchburg College Department of Physics
Characterization of Magnetic Thin Films using the Magneto Optic Kerr Effect Nicholas J. Savino Lynchburg College Department of Physics

2 Magnetization "Hysteresis Loop and Magnetic Properties." NDT
Resource Center. NSF-ATE, n.d. Web.

3 Magneto Optic Kerr Effect (MOKE)
Polarized Light Beam Initial Polarization Change in Polarization Sample Kerr, John. “XLIII. On Rotation of the Plane of Polarization by Reflection from the Pole of a Magnet.” Philosophical Magazine, vol. 3, no. 19, ser. 5, 1877, pp. 321–343. Davidson, Michael W. “John Kerr.” Molecular Expressions: Science, Optics and You, National High Magnetic Field Laboratory, 13 Nov

4 Thin Films Thin film of Ni and FePd (40 to 400 nm thick)
Si wafer (0.1 to 1 mm thick)

5 Crossed Polarizers Laser Photodetector Polarizer Chopper Analyzer
Electromagnet Crossed Polarizers

6

7 "Hysteresis Loop and Magnetic Properties." NDT
Resource Center. NSF-ATE, n.d. Web.

8 Data Hysteresis loop created by the Ni sample
Hysteresis loop created by the FePd sample

9 Applications Biebel , Harald. “Brilliant Hard Drive Quality with Magnetic Field Sensors Made of Diamond.” Phys.org, Fraunhofer Gesellschaft, 30 June 2016.

10 Future Work More samples
Cooling system allowing stronger magnetic field Applying fields at different orientations B B R.A. Lukaszew et al. / Applied Surface Science 219 (2003)

11 Acknowledgements Lukaszew Research Group at College of William and Mary, provided FePd capped with Au sample Dr. William Roach, research advisor NewMarket Corporation, Virginia Foundation for Independent Colleges, Summer Undergraduate Science Research Fellowship

12 Questions?

13 LabVIEW Block Diagram

14 Calibration

15 Methodology Lock-in and chopper set to 650 Hz
Polarizer oriented at approximately 320 degrees, analyzer oriented at approximately 170 degrees, nearly crossing the two The samples tested were: 100 nm Ni thin film sample on Si wafer (Ni) 100 nm Ni thin film sample on 300 nm SiO2 on Si wafer (Ni on SiO2) 40 nm FePd thin film sample capped with 5 nm Au (FePd capped with Au)

16 Comparing Orientations
Hysteresis loops created by Ni sample in orientation 1 in blue, orientation 2 in orange Hysteresis loops created by Ni (on SiO2)sample in orientation 2 in black, orientation 1 in red

17 Thank you!


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